流盤回放案例集ni市場部semiconductor brochure new

1、National National 引言NI助您應(yīng)用成功23NI45ADC/DAC電源管理IC (PMIC)無線引言NI助您應(yīng)用成功23NI45ADC/DAC電源管理IC (PMIC)無線ICRFIC)微電子機械系統(tǒng)(MEMS)NINI半導(dǎo)的設(shè)計日益復(fù)雜，與之相應(yīng)，對測NI半導(dǎo)的設(shè)計日益復(fù)雜，與之相應(yīng)，對測試系統(tǒng)也提出了高要求，以滿足驗證與測試的新需求. NI為中心的測通過靈活的模塊化架構(gòu)可大大降低綜合測試成本，縮短測試同時增加測試覆蓋率，幵可在研發(fā)驗證測試與批量生產(chǎn)測試之組件. 今天，許多世界領(lǐng)先的半導(dǎo)體廠復(fù)用系統(tǒng)硬件模塊采用NI的測，所驗證或檢測的半導(dǎo)體產(chǎn)品非常廣包拪ADC、PMIC、RF

2、IC、MEMS等NI硬: PXI (PCI s for Instrumen ion) 是業(yè)內(nèi)領(lǐng)先的自動化測, 它結(jié)合了PCI / NI硬: PXI (PCI s for Instrumen ion) 是業(yè)內(nèi)領(lǐng)先的自動化測, 它結(jié)合了PCI / PCI 總線的高吞吐量、低延時與CompactPCI的模塊化封裝形式, 同時針對測試應(yīng)用添加了高性能同步與定時總線以及相應(yīng)的 規(guī)范, 便于測試系統(tǒng)開發(fā)與集成. 經(jīng)過十多年的發(fā)展, 如今全球超過70家廠商可提供超過1500種PXI產(chǎn)品, 您可根據(jù)系統(tǒng)具體指標(biāo)要求選擇不同的模塊化儀器, 同時可以與基于GPIB, LAN等線或 的其他儀器組成混合總線系統(tǒng)RF信

3、號發(fā)生器/分析數(shù)字萬用表/LCR567數(shù)字化儀/ ; 高達(dá)16bits, 400 MS/s高達(dá)200復(fù)用器,矩陣開關(guān)超過150: NI提供完整工具，覆蓋硬件管理與驅(qū)動、測試程序開發(fā)、測試管理、數(shù)據(jù)管理等不同幫助半導(dǎo)體測試用戶快速實現(xiàn)自定制的測量功能NI LabVIEW測試開自動化測試領(lǐng)域的主流開與PXI模塊化硬件及基于GPIB/LAN等接口的儀器無縫集內(nèi)置大量分析與處理函數(shù)，提高開發(fā)效良好的人機界面；可選報表生成、數(shù)據(jù)庫連接等工具NI TestStand測試管專業(yè)的測試管系統(tǒng)集成效率和測試集成多種語言編寫的測試代碼，快速構(gòu)建測試強大的測試管理引擎，支持試優(yōu)操作員權(quán)限管生支持通過LabVIEW定

4、義操作員界面等功3NI基于PXI為研發(fā)階段的驗證測試 (Validation/Verification) 解決方案，加速產(chǎn)品投放市場的時間；同時，對于生產(chǎn)測試，它可顯著降低測試系統(tǒng)成本，縮小系統(tǒng)體積，提高測試速度NI基于PXI為研發(fā)階段的驗證測試 (Validation/Verification) 解決方案，加速產(chǎn)品投放市場的時間；同時，對于生產(chǎn)測試，它可顯著降低測試系統(tǒng)成本，縮小系統(tǒng)體積，提高測試速度和覆蓋率，增加測試資產(chǎn)的投資回報. 此外，可以在驗證測與生產(chǎn)測試過程中充分復(fù)用系統(tǒng)組件與數(shù)據(jù)，加速半導(dǎo)體產(chǎn)品從設(shè)計到量產(chǎn)測試的整個周期正是廠于這些優(yōu)勢，包拪TIog Device、Freesca

5、le、Infineon、STMicroelectronics在內(nèi)的多家半導(dǎo)均已采用實現(xiàn)其測試解決方案設(shè)制封ChipFinalADC/DAC測試Austria Microsystems基于NI 實現(xiàn)ADC/DAC特性驗證測電源管理IC測ON Semiconductor基于NI PXI與NI LabVIEW實現(xiàn)PMIC特性測RFIC/無線IC測TriQu 基于NIPXI驗證測MEMS測試og Device基于NI PXI和LabVIEW進(jìn)行MEMS麥克風(fēng)測測試、LED/分立器件測試微處理器參數(shù)特性測4趨勢ADC/DAC越來越多地被集成到SoC設(shè)計需要減小體積和功耗，同趨勢ADC/DAC越來越多地被

6、集成到SoC設(shè)計需要減小體積和功耗，同時測試復(fù)雜度增主要測量指標(biāo)動態(tài)指標(biāo): SINADTHDSNR, SFDR, EOB,IMD線性度測試: 電流/功耗測試IIHIIL電壓參數(shù)VOHVOLVIH, 增益與偏置DAC測試配置選擇ADC測試配置選擇og 14-bit,100MS/sDigitizer(PXIe-24-bit,500kS/sto16-bit,15MS/sDigitizer(PXI-200MS/s,12-BitDigitizer/Oscilloscope(PXI-2GS/sDigitizer/Oscilloscope,Optimized forAutomated Test(PXI-2G

7、S/sDigitizer/Oscilloscope,Optimized forAutomated Test(PXI-12.5GS/sDigitizer/Oscilloscope, Optimized for AutomatedTest (PXIe-og 16-bit,200MS/sArbitrary WaveformGenerator(PXI-16Bit100MS/sArbitrary WaveformGenerator(PXI-16Bit 400MS/s Dual Channel Di WG (PXIe- 200MHzHigh-speedDIO withinPMU(PXIe- 100MHz,

8、SelectableVoltage,High-ChannelCount(PXI-200MHz,SelectableVoltage,High-ChannelCount(PXIe-400Mb/sDigitalStimulus Response(PXIe-50MHzDigitalI/O (NI-DCParametricSMU:100VDCPWR(PXI-SMU:SourceMeasureUnit(PXI- 200MHzHigh-speedDIO withnPMU(PXIe- 100MHz,SelectableVoltage,High-ChannelCount(PXI-200MHz,Selectabl

9、eVoltage,High-ChannelCount(PXIe-400Mb/sDigitalStimulus Response(PXIe-50MHzDigitalI/O (NI-DCParametricSMU:100VDCPWR(PXI-SMU:SourceMeasureUnit(PXI-SMU:erSupply(PXI-SMU:4ChannelFPGA-based (PXIe-Switching/544-Crosspo FETMatrixSwitch (PXI-LabVIEW,TestStand, C.Net,SwitchSMU:erSupply(PXI-SMU:4ChannelFPGA-b

10、ased (PXIe-Switching/544-Crosspo FETMatrixSwitch (PXI-LabVIEW,TestStand, C.Net,Switch5ADC/DAC奧地利微電子公司基ADC/DAC奧地利微電子公司基于PXI、LabVIEW與DIAdem為ADC進(jìn)行自動化特性描述測ManfredPauritsch -University ofApp d WolfgangKoren- TheReplacing existing benchtop equipment fully automatic measurement system to accura y og-to- Th

11、e) to improvequality, reducecosts,and shortentestdevelopmentCreating a measurement system based on PXI components capable of performing a variety of measurements nonlinearity (INL), differential nonlinearity (DNL), and signal-to-noise-distortion ratio (SINAD) to characterize StandardLinear (SLI) pro

12、ductline of from Before we release our egrated circuits o full production, we have to thoroughly test their performance over a given temperature range using an adequate amount of s les. By implementing this pro s, we can deliver high-quality parts to our customers.Austriamicrosystems is a global lea

13、der he design manufacture of high performance og egrated (ICs). We leverage our expertise in providing low er Typicaldescriptionof inputandoutputsignals onanhigh accuracy best-in-class products for industrial, medical, and automotive markets worldwide. WeEach productuses either a serialor parallel d

14、igital connection develop and produce industry-leading og semiconductors,to a microcontroller. Our A are comprised of single- including high performan tandard products and customizedended as well as true-differential products with up to eight In cooperation with the Automation Systems MeasurementSeq

15、uenceforan the University of App d Scien in Graz, Austria, weWe divided the ADC measurements onine different groups developed a fully automatic measurement system based ont cover allof the parameters for the chip. In addition to the PXI, which supports the accurate characterization of A .respective

16、data sheet parameters, we characterized additional We used this measurement system to characterize A fromspecifications t are correlated with the converter quality the Standard Linear (SLI) product line of and provide valuable findings for further development. testgroupsfor theADC includethe Our ADC

17、 portfolio of standard products contains 10- and 1) Dynamicbit converters t can s le at up to 400 kS/s with very lowa.SINAD-Signal-to-noise anddistortionratio erconsumption.b. SNR - Signal-to-noise ratio6ADC/DACTHD -Total harmonicEOB -Effective numberofbitsPHSN- Peak harmonicorspuriousnoise2) S isti

18、cal The PXI-6552 module is a 100 MHz digital t providesADC/DACTHD -Total harmonicEOB -Effective numberofbitsPHSN- Peak harmonicorspuriousnoise2) S istical The PXI-6552 module is a 100 MHz digital t provides 20 channels of DIO programmable voltage levels for VOH, VOL, VIH, VIL. The digital yzer captu

19、red the output a.INL egralthe ADC and was synchronized with the ARB to create tightlycorrelatedmixed-signalb.DNL-Differential 3) Offset Performance(Offsets, ermodulationDistortionThe PXI-4130 four quadrant source measure unit (SMU) a. IMD ermodulationPXI-4110 er Supply were used b.ISO c.Second/Third

20、Order5) Logic Inputs(InputHigh/Low parametric measurements on the ADC requiring up to 1 nAcurrent resolution. We used er supply to er to the ADC and monitor supply current, while SMU was used to characterize high and low voltage levels ernalPerformance(Bandgap,VBG,TK, IREF,Energy Performance(Current

21、consumption,digital inputs, or to ink current on digital outputs simulateabustwould bedriven bytheand Capacity Performance apacitance, InputThe PXI-6259 is a mixed-signal, high-speed data By automatingthe measurementsequence, we characterized a large numberofconverters fromongoingproduction toobtain

22、 a coherent s istical picture of the respective parameters theproductiontoleran I/O capabilities. We used this module to capture ng information and controlernalswitchesonthe ysis board to select different test modes on the ADC.The measuring s ion also consists of a programmable er supply, three mult

23、imeters, one 100 MHz oscilloscope, 400 MHz digitizing oscilloscope, and one external function/arbitrary waveform generator. We used these instruments in conjunction wi temperature chamber thermostream for temperature characterization to We chose the components for the measurement system regard to th

24、eir measurement . We wanted the system to be comple y automated with synchronized generation and acquisition signals. The core of the system is an NI PXI chassis t contains an NI PXI-5422 waveform generator, an NI PXI-6552 digital he entire specified temperature range of yzer, an NI PXI-4130 source

25、measure unit, NI PXI-4110 er supply, and an NI 6259 multifunction data acquisition (DAQ) following describes how each of these instruments were used in our system.The PXI-5422 module is a 16-bit, 200 MS/s arbitrary waveform generator (ARB) used for time and measurements requiring high bandwidth. Weu

26、sed ARBto send a variety og patterns to the ADC for DNL, SNR, and a number of other specifications to characterize its performance. The synchronization provided by PXI allowed us to operate the ARB as a phase- ysisBoardof7ADC/DACThe University of App d developed Once the LabVIEW execution completed,

27、 the test data transferredtoNIDIAdemsoftwarewhichwasADC/DACThe University of App d developed Once the LabVIEW execution completed, the test data transferredtoNIDIAdemsoftwarewhichwasusedtocreatea fully automated measurement log.board elligent design to most automated evaluation of the entire ADC. To

28、 automate measurements, we og signals from the waveform generator directly over a relay to Improving Test Time, Costs and Quality of ADC Our test system demonstrates how a well-measurement system using off-the-shelf hardware software components with PXI can considerably improve respective inputs of

29、the ADC. The response of the ADC measured using the digital yzer. We also the high-speed digital instrument to operate the digital lines for the ADC, and synchronized both the arbitrary waveform generator and the high-speed digital quality of semiconductor egrated using NI T-Clock, measurementsuch a

30、s PXIoffer tightly correlated generation and signals through clock synchronization for characterization our . Using PXI, we gre y improved thequality of Measurement We developed the complete acquisition ADC characterization tests and reduced test costs by control valuable test development time. The

31、system e using NI LabVIEW. LabVIEW VIs control the standard ADC test system forall characterization engineers at austriamicrosystems. We saved important and expensive ysis time using this approach and, due to the high- reusability factor of the system hardware and software, willalso beabletorealize

32、futureprojectssystem, which we o subVIs for various including group-pattern generation, digital acquisition, og signal generation/acquisition. Each subVI controls respective tasks for a routine and any l tmay be needed. The of each o pattern-oriented structure guarantees reusability when Thenewchara

33、cterizationtestbench,basedonPXI,is andeasyto use,savingvaluabletestdevelopmentimprovingthequality ofourADC Theold characterizationtestbenchconsistedofmany differentinstruments,whichtookup alot of roomandwerehardto 8ADC/DAC科技 (Sunplus)ADC/DAC科技 (Sunplus) 基于PXIDAC測試時間縮短, SunplusTechnology Thea system

34、to quickly and efficiently TheUsing the NI LabVIEW development environment and PXI hardware to create a testplatformt redutest time by 97 percent.Previously,validationtesting forDAC tookaHigh-SpeedHardware 10 working days. This inefficienrdware test mWe achieved a significant reduction of test time

35、by replacing too much time, and it was difficult for the engineer to quicklythe original test environment with NI PXI hardware. identify problems on the electric circuit, andhe time-past, due to the speed limi ion of GPIB and digital constrained semiconductor industry, this became a seriousmultimete

36、rs it took ocond to finish testing voltage. To finishtestinganentire channel, ittookabout10.5hrs.With its exceptional efficiency, the NI PXI-4071 digital multimeterTo help resolve this ie, we used the LabVIEW graphicalthe test time of per step voltage to 33 ms. Thus, it development environment wicom

37、bination of digitalnow takes lessn20minutestofinishtestingtheentire item, multimeters, digital I/O devi, and switches to raremendous time savings.extract data and reduce test time by 97 percent. By switching the testing approach, we also reduced errors caused by the manualconfiguration ofplugs,which

38、 furtherimproves testing roductionofSoftware-Defined Theobjectives ofthisprojectan automated testing system forsystems used in digital electronic household applianImprovingtheperformanceofproductReducing the frequency of repetitive human manipulation by implementing a standardized automated platform

39、Theentiretesting infrastructurewaso Sunplusachievedasignificant reductionoftesttime andsoftware replacingtheoriginal testenvironmentwith NI PXI9ADC/DACUsingtheNI PXI-ersupply to replacetheX-Yplotstoshowthevoltage changeperADC/DACUsingtheNI PXI-ersupply to replacetheX-Yplotstoshowthevoltage changeper

40、digital Ability to automatically change the test mode to show the current pin configuration s us of the NI PXI-6542 high- speed digital I/O deviceManualconfiguration blockChoiceofthefiles directory andformat(.txt or Single s usmeasurementswithreal-time er supply provides a stable source of voltage f

41、or the t canbe controlled and minimizes the testing space. Due the testing requirements, each channelcan be switched to different s for different current value full current (37.5 ) and 1/4 current (150 ). Previously, had toswitch the electronic current by manually soldering resistor.Forto change le,

42、 to testa chip with fourchannels wes in one electric current. It was We developed the new testing platform sucsfullyusingNI PXI modules to reduce the testing time from 4,756 s to 138 s. he competitive electronic industry, time is of the essence and it is imperative to minimize the time frame from R&

43、D mass production. Therefore, the testing time is consuming, and it increased the risk of the pad falling off pr edcircuit Building uitiveFront PanelUsingWe used LabVIEW graphical programming software as he s of the whole s. The development environment to construct uitive frontefficient automated te

44、sting platform generated from the combination of National Instruments software and has gre y reduced the testing time. Our department is erface. The front panel displays the real-time testing s us and each block functions according to the following:InitialDAC voltage and the reference voltage value

45、to thelevel beingable to produce the most accurate testing numbers Real-time 電源管理ICPMIC)電源管理器件包拪AC-DCandDC-DCLowdropout(LDO)電源管理ICPMIC)電源管理器件包拪AC-DCandDC-DCLowdropout(LDO)linear Display/LED發(fā)展趨勢更低的輸出電壓電平與靜態(tài)電負(fù)載電流突變時需要更快的響應(yīng)主要測量指標(biāo)erSupplyRejectionRatioSource/measurecurrent&voltageon nsVCC, ICC, IBST等erc

46、onverterefficiency(quiescent&shutdownPMIC測試配置選擇og 14-bit,100MS/sDigitizer(PXIe-24-bit,500kS/sto16-bit,15MS/sDigitizer(PXI-16-bit,200MS/sArbitrary WaveformGenerator(PXI- 200MHzHigh-speedDIO withinPMU(PXIe- 100MHz,SelectableVoltage,High-ChannelCount(PXI-200MHz,SelectableVoltage,High-ChannelCount(PXIe-

47、400Mb/sDigitalStimulus Response(PXIe-50MHzDigitalI/O (NI-DCParametricSMU:100VDCPWR(PXI-SMU:SourceMeasureUnit(PXI-SMU:erSupply(PXI-Switching/544-Crosspo FETMatrixSwitch (PXI-LabVIEW,TestStand, C.Net,Switch電源管理IC (PMIC)德州儀器電源管理IC (PMIC)德州儀器 (TI) 通過NI的軟硬測的吞吐量、測試覆蓋率以及可靠SambitPanigrahi, Texas Thea modula

48、r test t is abstract, scalable, modular, and to use; supports test sequencing dreds er management (PMIC);and eracts with multiple instruments,evaluation modules,and measureunitsTheUsing NI LabVIEW software and NI TestStand to build a flexible and modular automated test solution t can test severalPMI

49、Cs with different requirements, communications buses, and protocols; and is easy to use for engineers who do no ve computerscience backgrounds.adhere to multiple standardch as Smart Battery System (SBS) and Japan Electronics and IT Industries Assoinstrument drivers, as well as t could (JEITA) standa

50、rds. We needed to develop a system to test such as a screen capture utility and outputofthesefirmwarefeatures. There are many types of PMICs available depending on We reused low-level OCX drivers from our EV2300customer budget, prediction algorithm complexity, features Evaluation Module to communica

51、te with ourrequested, andended end application. Develoan in- management devi. We used LabVIEW and NI TestStandhousesoftwareand sequencingsuite is challenging becauseof as the primary programming language and sequencer; andthe varying requirements, complexity, and feature differen defined hardware an

52、d software abstraction layers to haven the different IC options forer management. practically no dependence on any particular hardware orBecausealloptionsneedtobesupported bythesamesoftware and sequencing suite, we decided to develop a solution on LabVIEW and NI TestStand. We used the Automating the

53、 Pro ser, and modularity of NI software to easilyMost of the common functionalities tested for firmware what would have been extremely challenging with other include charging/discharging simulation, firmware parameter softwaretools.detection, and temperature and communication withthedevice toread/wr

54、ite o theNI TestStand satisfied all of our requirements scripting support, ease of use, on-the-go sequence Typically, er management devi have an og modification, and report generation. It is a erful test component ( og front end) and a digital component management software platform t came equipped w

55、ith (micropro sor) to make deci s. A combination of these almostallofour required features,alongwith features twe components is used to implement multiple functionalitie ch didnotforesee needing.as protection features, charge management, with host devi , and battery life prediction. It also needs to

56、 We used LabVIEW because of its erful 電源管理IC (PMIC)support and readily available drivers. It worked with our existing OCX drivers and can be heavily implemented at TI in lab automation scenarios.One of the primary motivations for abstraction was for the user. Our setup is used by engineers who are f

57、amiliar dvanced LabVIEW programming Byabstracting, wereducedcomplexity for the The softwarearchitecture consistsofmultiplecomponents.NI TestStand serves as the dominant test executive due to erfulengine, supportofvarious coding/scriptingAdvantagesofWe have realized severalbenefits using our automati

58、on whichare hefollowing and multiple reporting options. We also in BenefitofFor the test scripts, we 電源管理IC (PMIC)support and readily available drivers. It worked with our existing OCX drivers and can be heavily implemented at TI in lab automation scenarios.One of the primary motivations for abstrac

59、tion was for the user. Our setup is used by engineers who are familiar dvanced LabVIEW programming Byabstracting, wereducedcomplexity for the The softwarearchitecture consistsofmultiplecomponents.NI TestStand serves as the dominant test executive due to erfulengine, supportofvarious coding/scripting

60、AdvantagesofWe have realized severalbenefits using our automation whichare hefollowing and multiple reporting options. We also in BenefitofFor the test scripts, we TimeTakenTestengineerspart-time attention 3 days Reducedtimebydeveloped in LabVIEW, called by NI TestStand. We also use an equal amount