mt cx5820cf功能驗(yàn)證測試報(bào)告

TableofContents

Introduction 7

Overview 7

Acronym 8

DUTInformation 8

DUTinformationList 8

DUTPicture 9

TestEquipment 10

TestConclusion 11

DetailList 11

BUGlist 11

Basicfunctionunit 11

HardwareEquipment 11

Testtopology 12

Housingtesting 12

Testmethod 12

TestResult 12

Buttoncheck 13

Testmethod 13

TestResult 13

LEDstatustest 13

Testmethod 13

TestResult 13

InterfaceBasicfunctiontest 14

Testmethod 14

TestResult 14

Poweron/offtest 14

Testmethod 14

TestResult 14

PI 15

HardwareEquipment 15

Testtopology 15

DUTLoadSetup 15

Powerupsequenceandovershoottest 16

Testmethod 16

PassCriteria 16

TestResult 21

Testlog 22

DCcharacteristicandRippleNoise 39

Testmethod 39

PassCriteria 39

TestResult 43

Testlog 44

ACtoDCPoweronrushcurrent 57

Testmethod 57

PassCriteria 57

TestResult 57

Testlog 58

SI 58

HardwareEquipment 58

Testtopology 59

DUTLoadSetup 59

Resettest 60

Testmethod 60

PassCriteria 60

TestResult 60

Testlog 60

CLKtest 61

Testmethod 61

PassCriteria 61

TestResult 61

Testlog 62

Powerconsumption 64

OverallConsumptionTest 64

HardwareEquipment 64

Testtopology 64

DUTFullLoadSetup 64

Testmethod 65

PassCriteria 65

TestResult 65

Testlog 66

Ethernetunit 66

ElectricalCharacterization_100M 錯(cuò)誤！未定義書簽。

HardwareEquipment 錯(cuò)誤！未定義書簽。

Testtopology 錯(cuò)誤！未定義書簽。

Testmethod 錯(cuò)誤！未定義書簽。

PassCriteria 錯(cuò)誤！未定義書簽。

TestResult 錯(cuò)誤！未定義書簽。

Testlog 錯(cuò)誤！未定義書簽。

ElectricalCharacterization_1000M 66

HardwareEquipment 66

Testtopology 67

Testmethod 67

PassCriteria 67

TestResult 67

Testlog 67

Introduction

Overview

Functionallyverificationtestishardwareengineeringvalidationtest.Engineerscantreatitashardwarebring-uptestandisexpectedtogooverthistestmatrixbeforefurtherintensivetestoractivities.FeaturesthatcannotbeverifiedearlierhavetobeperformedandpassedduringEVTthatisbeforeprojectphasesintopilotrunstage.Thisisagenerictestplanforallproductlinesandfocusontestingmethodologyonly.Foraspecificproduct,systemvenderhastorespondtoderiveaspecifictestplanandreportwithitsspecificfeaturesandfunctionalitiesbasedonthemethodologyofthisplanduringprojectdevelopmentperiod.D-Linkshouldrespondtoapprovethetestplanandreportinadvance.Thetestjustquicklygoesthroughallfeatureswhichhavebeendesignedandutilizesdebugtooloranyexistingsoftwaretoverifythembyhardwareviewpoint.Awhiteboxinspectioninsteadblackboxtestinggetsmorecoveragedownintothedesign.

Thephilosophyofthistesttomakesurealldesignedfeaturesisfunctionaland

getsverified.Therearesomefunctionsandfeaturesdesignedfordebug;futureneededoradvancefeatureswhichsoftwarehavenotimplementedyet.Thesefeaturesmaynotbetestedimmediatelyevenafterproductisshipped.Topreventanyunrecoverableorcallbackrisk,adetailtestmatrixisnecessarytogothrough.

Acronym

AcronymsList:

Acronym

Definition

DUT

DeviceUnderTest

PCBA

PrintedCircuitBoardAssembly

PSU

PowerSupplyUnit

DC

DirectCurrent

DC2DC

DCtoDCPowerConverter

PC

PersonalComputer

NIC

NetworkInterfaceCard

HW

Hardware

SSID

ServiceSetIdentifier

SOHO

SmallOffice/HomeOffice

LV

TheLowestVoltage

HV

TheHighestVoltage

Vp-p

TheVoltageofPeaktoPeak

DUTInformation

DetailedDUTinformationisveryimportanttotrackfollowing.ItisexpectedtolisttheallPCBAinformationonthesystem,forexampleDUTnumber,serialnumber,hardwarerevisionandsoftwarerevision,etc.

DUTModelName

MT-CX5820CF

MainPCBAVersion

V1.0

DUTinformationList

Firmwareversion

centecOS-mpc-MT8T12X-v0.0.1

PSU(orAdaptor)Modelname

KHD-10012

PSUInput/OutputParameters

input:90V-240ACOutput:12V/4.2A

PSU(orAdaptor)Version

V1.5

KeyChip

CPU:P1014MAC:CTC5160

GEPHY*8:VSC8558GEPHY*1:VSC8211

IPsetting

192.168.3.200

DUTPicture

Housing

DUT

TestEquipment

Name

Manufacturer

Model

AssetNumber

Useful-life

Oscilloscope

LeCroy

620Zi

LCRY2809N59835

2014-12-15

ACSource

CXTECH

61020

MTJCSB0050

2014-12-15

DigitalPowerMeter

EVERFINE

PF9800

MTJCSB0048

2014-12-15

Dataanalysis

NuStreams

600I

/

/

TestConclusion

DetailList

Testarea

TestItem

Reference

Conclusion

Basicfunctionunit

Housingtest

MTN

PASS

Buttoncheck

MTN

PASS

LEDstatustest

MTN

PASS

Interface Basic function

test

MTN

PASS

Poweron/off

MTN

PASS

PI

Power up sequence and

overshoot

MTN

PASS

DC characteristic and

RippleNoise

MTN

PASS

ACtoDCPoweronrushcurrent

MTN

PASS

SI

Resettest

MTN

PASS

CLKtest

MTN

PASS

PowerConsumption

OverallConsumption

MTN

PASS

Ethernetunit

Electricalcharacterization

IEEE802.3

PASS

BUGlist

HwVer.

Title

Level

State

Remarks:/

Basicfunctionunit

HardwareEquipment

Dataanalysis:Nustreams-600I;

Testtopology

Housingtesting

Testmethod

CheckalltheStructuraltestingaccordingtothechecklistasfollow.

TestResult

Item

Criteria

TestData

TestResult

Unit

LED/Silk-screen

Tomeettherequirements

OK

PASS

connector

Tomeettherequirements

OK

PASS

gap

Tomeettherequirements

OK

PASS

mouldappearance

Tomeettherequirements

OK

PASS

up-rightfunction

NA

NA

NA

antenna

NA

NA

NA

PCBA

heatsinks/shieldingcase

Tomeettherequirements

OK

PASS

DIPinterference

Tomeettherequirements

OK

PASS

RFcable/opticalcable

Tomeettherequirements

OK

PASS

Assembly

antenna/opticalcable

NA

NA

NA

interference

Tomeettherequirements

OK

PASS

PCBandmouldmatching

Tomeettherequirements

OK

PASS

fightscrew

NA

NA

NA

Assembly

Tomeettherequirements

OK

PASS

Buttoncheck

Testmethod

Testwhethereachofthebuttonstoenableordisable.

TestResult

Item

Criteria

TestData

TestResult

Resetbutton

Presstheresetbuttonfor5s,thesystemresettothefactorysetting

OK

PASS

LEDstatustest

Testmethod

ChecktheLEDdesignofDUT,Insurecolor，brightnessandstatesaccording.

TestResult

Item

Criteria

TestData

TestResult

LED

Color

Status

LAN

Green

ON

ThesystemoperatesontheSwitch

OK

PASS

Blinks

Datatransmit

OK

PASS

OFF

Poweroff

OK

PASS

InterfaceBasicfunctiontest

Testmethod

ChecktheInterfaceBasicfunctiondesignofDUT.

TestResult

Item

Criteria

TestData

TestResult

Interface

Status

LAN

connect

NormalconnectsandThePingpackageisok.

OK

PASS

Poweron/offtest

Testmethod

Undernormaltemperature,Poweron-offtheDUT.Usedbutton,flashboardbuttonandusedinsertconnection-peg(containAdapterinputandoutput),atleast5times,TheDUTallfunctionmustbenormaleverytime.

TestResult

Item

Criteria

Test

Data

Test

Result

Flashboardbutton

Afterthetest,DUTallfunctionisnormal.

OK

PASS

Connection-pegAdapterinput

Afterthetest,DUTallfunctionisnormal.

OK

PASS

Connection-pegpoweroutput

Afterthetest,DUTallfunctionisnormal.

OK

PASS

PI

HardwareEquipment

Oscilloscope:LeCroy620Zi;Dataanalysis:Nustreams-600I;ACsource:CXTECH61020.

Testtopology

DUTLoadSetup

DUTEth1&Eth8,SFP1&SPF12connecttoNuStreams,PortsSetupasbelow:

SAPort

DAPort

Stream

Length(byte)

Eth1(VLAN11)

Eth2(VLAN11)

1000Mbps*100%

Random

Eth2(VLAN11)

Eth3(VLAN12)

1000Mbps*100%

Random

Eth3(VLAN12)

Eth4(VLAN12)

1000Mbps*100%

Random

Eth4(VLAN12)

Eth5(VLAN13)

1000Mbps*100%

Random

Eth5(VLAN13)

Eth6(VLAN13)

1000Mbps*100%

Random

Eth6(VLAN13)

Eth7(VLAN14)

1000Mbps*100%

Random

Eth7(VLAN14)

Eth8(VLAN14)

1000Mbps*100%

Random

SFP1(VLAN15)

SFP2(VLAN15)

10000Mbps*100%

Random

SFP2(VLAN15)

SFP3(VLAN16)

10000Mbps*100%

Random

SFP3(VLAN16)

SFP4(VLAN16)

10000Mbps*100%

Random

SFP4(VLAN16)

SFP5(VLAN17)

10000Mbps*100%

Random

SFP5(VLAN17)

SFP6(VLAN17)

10000Mbps*100%

Random

SFP6(VLAN17)

SFP7(VLAN18)

10000Mbps*100%

Random

SFP7(VLAN18)

SFP8(VLAN18)

10000Mbps*100%

Random

SFP8(VLAN18)

SFP9(VLAN19)

10000Mbps*100%

Random

SFP9(VLAN19)

SFP10(VLAN19)

10000Mbps*100%

Random

SFP10(VLAN19)

SFP11(VLAN20)

10000Mbps*100%

Random

SFP11(VLAN20)

SFP12(VLAN20)

10000Mbps*100%

Random

Powerupsequenceandovershoottest

Testmethod

UseOscilloscope+Activeprobemeasuredpoweron/downsequencewhentheDUT(DUTonfullloadstates)poweronandpowerdown,Demandattentionit’severysourceovershootandeachothersequence.

PassCriteria

U3-P1014powerupsequence&overshootcriteria:

U4-DDR3-K4B4G1646Qpowerupsequence&overshootcriteria:

U8-SST39VF040powerupsequence&overshootcriteria:

U9-K9F4G08U0Epowerupsequence&overshootcriteria:

U11-CTC5160powerupsequence&overshootcriteria:

U14-VSC8211powerupsequence&overshootcriteria:

U22-VSC85581powerupsequence&overshootcriteria:

PowerSequencingcriteria:

3V3_THERM→1V05→1V0→3V3→2V5→1V8→1V2→1V5

U3-P1014-powerupsequencing:

TestResult

Item

Criteria(V)

TestData(V)

TestResult

U1-3.3V-overshoot

-0.5~3.63

-0.086~3.32

PASS

U2_SI5335-3.3V-overshoot

-0.5~3.63

-0.067~3.32

PASS

U3_P1014-3.3V-overshoot

-0.3~3.63

-0.059~3.31

PASS

U3_P1014-2.5V-overshoot

-0.3~2.75

-0.073~2.48

PASS

U3_P1014-1.5V-overshoot

-0.3~1.65

-0.052~1.53

PASS

U5_DDR3-1.5V-overshoot

-0.4~1.975

-0.019~1.52

PASS

U6-3.3V-overshoot

-0.5~3.63

-0.086~3.32

PASS

U8_SST39VF040-3.3V-overshoot

-0.5~3.8

-0.086~3.32

PASS

U9_K9F4G08U0E-3.3V-overshoot

-0.6~3.6

-0.086~3.36

PASS

U11_CTC5160-3.3V-overshoot

-0.5~3.8

-0.062~3.30

PASS

U11_CTC5160_NTCLK-1.8V-overshoot

-0.4~1.95

-0.046~1.85

PASS

U11_CTC5160_TKAVDD-1.8V-overshoot

-0.4~1.95

-0.058~1.84

PASS

U11_CTC5160-1.2V-overshoot

-0.5~1.32

-0.039~1.23

PASS

U11_CTC5160-1.06V-overshoot

-0.4~1.1

-0.046~1.08

PASS

U14_VSC8211-Vcc-3.3V-overshoot

-0.4~4.0

-0.086~3.38

PASS

U14_VSC8211-PHY-3.3V-overshoot

-0.4~4.0

-0.098~3.37

PASS

U14_VSC8211-Vcc-2.5V-overshoot

-0.5~2.75

-0.050~2.45

PASS

U14_VSC8211-PHY-1.2V-overshoot

-0.5~1.5

-0.059~1.22

PASS

U15-3.3V-overshoot

-0.5~3.63

-0.069~3.40

PASS

U20-3.3V-overshoot

-0.5~3.63

-0.086~3.32

PASS

U22-VSC85581-3.3V-overshoot

-0.5~4.0

-0.098~3.37

PASS

U22-VSC85581-Vcc-1.2V-overshoot

-0.5~1.4

-0.048~1.23

PASS

U22-VSC85581-PHY-1.2V-overshoot

-0.5~1.4

-0.048~1.24

PASS

SFP-3.3V-overshoot

-0.5~3.63

-0.069~3.40

PASS

U30-3.3V-overshoot

-0.5~3.63

-0.069~3.32

PASS

M1_PowerVcc-12V-overshoot

-0.5~13.2

-0.011~12.21

PASS

PowerSequencing

3V3_THERM→

1V05→1V0→

3V3→2V5→1V8

→1V2→1V5

Accordingtotheactualwaveform

PASS

U3-P1014-powerupsequencing

<50ms

7.92ms

PASS

Testlog

U1-3.3V-overshoot:

U2_SI5335-3.3V-overshoot:

U3_P1014-3.3V-overshoot:

U3_P1014-2.5V-overshoot:

U3_P1014-1.5V-overshoot:

U5_DDR3-1.5V-overshoot:

U6-3.3V-overshoot:

U8_SST39VF040-3.3V-overshoot:

U9_K9F4G08U0E-3.3V-overshoot:

U11_CTC5160-3.3V-overshoot:

U11_CTC5160_NTCLK-1.8V-overshoot:

U11_CTC5160_TKAVDD-1.8V-overshoot:

U11_CTC5160-1.2V-overshoot:

U11_CTC5160-1.06V-overshoot:

U14_VSC8211-PHY-3.3V-overshoot:

U14_VSC8211-PHY-1.2V-overshoot:

U20-3.3V-overshoot:

U22-VSC85581-3.3V-overshoot:

U22-VSC85581-Vcc-1.2V-overshoot:

U22-VSC85581-PHY-1.2V-overshoot:

SFP-3.3V-overshoot:

U30-3.3V-overshoot:

M1_PowerVcc-12V-overshoot:

PowerSequencing：3V3_THERM→1V05

1V05→1V0

1V0→3V3

3V3→2V5

2V5→1V8

1V8→1V2

1V2→1V5

U3-P1014-powerupsequencing:

DCcharacteristicandRippleNoise

Testmethod

UseOscilloscope(bandwidthmorethan500MHz）+Activeprobe,setBandwidthto20MHz,Timebasemorethan2ms/div(thememorydepthsetMax),Verticalto20mV/div.testparameterareMax,Min,Mean,andPK-PK，TestDCcharacteristicandRippleNoiseofPoweroutputandchipinput，theDUTonfullloadstates.

PassCriteria

U2_SI5335-PowerSupplyaccuracycriteria:

U3-P1014-PowerSupplyaccuracycriteria:

U4_DDR3-K4B4-PowerSupplyaccuracycriteria:

U8_SST39VF040-PowerSupplyaccuracycriteria:

U9_K9F4G08U0ESupplyaccuracycriteria:

U11_CTC5160-PowerSupplyaccuracycriteria:

U14_VSC8211-PowerSupplyaccuracycriteria:

U22_VSC85581-PowerSupplyaccuracycriteria:

TestResult

Item

DCcharacteristic(V)

Ripple(mV)

TestResult

Criteria

Testdata

Criteria(＜5%)

Testdata

Min

Max

M1_Power-12V-C21

11.4~12.6

11.827

11.970

＜600

138

PASS

U2_SI5335-3.3V-C126

2.97~3.63

3.23

3.27

＜165

40.5

PASS

U3_P1014-3.3V-C230

3.135~3.465

3.22

3.27

＜165

41.2

PASS

U3_P1014-2.5V-C220

2.375~2.625

2.42

2.46

＜125

33.9

PASS

U3_P1014-1.5V-C204

1.425~1.575

1.47

1.52

＜75

47.8

PASS

U3_P1014-1.0V-C244

0.95~1.05

0.99

1.04

＜50

49.8

PASS

U4_DDR3-K4B4-1.5V-C138

1.425~1.575

1.46

1.52

＜75

51.8

PASS

U6_3.3V-C172

3.135~3.465

3.23

3.27

＜165

40.5

PASS

U8_SST39-3.3V-C255

2.7~3.6

3.22

3.27

＜165

40.5

PASS

U9_K9F4G-3.3V-C252

2.7~3.6

3.23

3.27

＜165

39.9

PASS

U11_CTC5160-3.3V-C294

3.15~3.45

3.23

3.27

＜165

38.5

PASS

U11_CTC5160-TKAVDD-1.8V-C332

1.7~1.9

1.78

1.81

＜90

31.2

PASS

U11_CTC5160-AVDD-1.8V-C308

1.7~1.9

1.78

1.81

＜90

33.9

PASS

U11_CTC5160-1.2V-C399

1.14~1.26

1.18

1.22

＜60

38.5

PASS

U11_CTC5160-CPRE-1.06V-C341

0.85~1.1

1.00

1.03

＜53

36.5

PASS

U14_VSC8211-Vcc-3.3V-C417

3.0~3.6

3.23

3.27

＜165

37.2

PASS

U14_VSC8211-PHY-3.3V-C418

3.0~3.6

3.22

3.27

＜165

53.8

PASS

U14_VSC8211-Vcc-2.5V-C433

2.25~2.75

2.42

2.46

＜125

41.2

PASS

U14_VSC8211-PHY-1.2V-C443

1.14~1.26

1.14

1.18

＜60

41.2

PASS

U15-3.3V-C529

2.97~3.63

3.22

3.27

＜165

45.8

PASS

U20-3.3V-C551

2.97~3.63

3.22

3.27

＜165

50.5

PASS

U22-VSC85581-3.3V-C628

3.13~3.47

3.24

3.28

＜165

40.5

PASS

U22-VSC85581-Vcc-1.2V-C629

1.14~1.26

1.16

1.20

＜60

35.9

PASS

U22-VSC85581-PHY-1.2V-C607

1.14~1.26

1.15

1.18

＜60

24.6

PASS

SFP-3.3V-C460

2.97~3.63

3.22

3.27

＜165

45.2

PASS

U30-3.3V-C557

2.97~3.63

3.22

3.27

＜165

52.5

PASS

Testlog

M1_Power-12V-C21:

U2_SI5335-3.3V-C126

U3_P1014-3.3V-C230

U3_P1014-2.5V-C220

U3_P1014-1.5V-C204

U3_P1014-1.0V-C244

U4_DDR3-K4B4-1.5V-C138

U6_3.3V-C172

U8_SST39-3.3V-C255

U9_K9F4G-3.3V-C252

U11_CTC5160-3.3V-C294

U11_CTC5160-TKAVDD-1.8V-C332

U11_CTC5160-AVDD-1.8V-C308

U11_CTC5160-1.2V-C399

U11_CTC5160-CPRE-1.06V-C341

U14_VSC8211-Vcc-3.3V-C417

U14_VSC8211-PHY-3.3V-C418

U14_VSC8211-Vcc-2.5V-C433

U14_VSC8211-PHY-1.2V-C443

U15-3.3V-C529

U20-3.3V-C551

U22-VSC85581-3.3V-C628

U22-VSC85581-Vcc-1.2V-C629

U22-VSC85581-PHY-1.2V-C607

SFP-3.3V-C460

U30-3.3V-C557

ACtoDCPoweronrushcurrent

Testmethod

UseACSourceRegulatorsasavoltageinput,lettheproductrunningontheupperlimitvoltageandlowerlimitvoltageoftheDUT.AndUseOscilloscope+CurrentprobeTesttherushcurrentofTheACtoDCmodule,undertheDUTPowerupstates.

PassCriteria

Thepoweronrushcurrentshouldlessthan60A.

TestResult

Item

Criteria(A)

TestData(A)

TestResult

AC220V

＜60

3.75

PASS

Testlog

AC220V:

SI

HardwareEquipment

Oscilloscope:LeCroy620Zi;Dataanalysis:Nustreams-600I;ACsource:CXTECH61020.

Testtopology

DUTLoadSetup

DUTEth1&Eth8,SFP1&SPF12connecttoNuStreams,PortsSetupasbelow:

SAPort

DAPort

Stream

Length(byte)

Eth1(VLAN11)

Eth2(VLAN11)

1000Mbps*100%

Random

Eth2(VLAN11)

Eth3(VLAN12)

1000Mbps*100%

Random

Eth3(VLAN12)

Eth4(VLAN12)

1000Mbps*100%

Random

Eth4(VLAN12)

Eth5(VLAN13)

1000Mbps*100%

Random

Eth5(VLAN13)

Eth6(VLAN13)

1000Mbps*100%

Random

Eth6(VLAN13)

Eth7(VLAN14)

1000Mbps*100%

Random

Eth7(VLAN14)

Eth8(VLAN14)

1000Mbps*100%

Random

SFP1(VLAN15)

SFP2(VLAN15)

10000Mbps*100%

Random

SFP2(VLAN15)

SFP3(VLAN16)

10000Mbps*100%

Random

SFP3(VLAN16)

SFP4(VLAN16)

10000Mbps*100%

Random

SFP4(VLAN16)

SFP5(VLAN17)

10000Mbps*100%

Random

SFP5(VLAN17)

SFP6(VLAN17)

10000Mbps*100%

Random

SFP6(VLAN17)

SFP7(VLAN18)

10000Mbps*100%

Random

SFP7(VLAN18)

SFP8(VLAN18)

10000Mbps*100%

Random

SFP8(VLAN18)

SFP9(VLAN19)

10000Mbps*100%

Random

SFP9(VLAN19)

SFP10(VLAN19)

10000Mbps*100%

Random

SFP10(VLAN19)

SFP11(VLAN20)

10000Mbps*100%

Random

SFP11(VLAN20)

SFP12(VLAN20)

10000Mbps*100%

Random

Resettest

Testmethod

UseOscilloscope+Activeprobemeasuredallresetsignalsofchipsundernormaltemperaturewhensystempoweron,tochecktheeffectivevalueofresetsignaltomeetthedesignrequirements.

PassCriteria

ResettimeshouldmeettherequirementsofICdatasheet:

TestResult

Item

Criteria

TestData

TestResult

U20_Reset

120~280ms

243.3ms

PASS

Testlog

U20_Reset:

CLKtest

Testmethod

UseOscilloscope+Activeprobemeasuredtheoutputcharacteristicofallclocksignalwhentheproductonfullload,containFrequencyveracity,Dutycycle,H-width/L-width,fall/risetime,Flatnessandsoon,tocheckitmeetdesignrequirements.

PassCriteria

Theparametersoftheclockshouldmeettherequirementsofdatasheetorinternalrequirements.

TestResult

Item

Criteria

Testdata

TestResult

TestPoint

Signal

Y1

Monotonic

Monotonic

Monotonic

PASS

Frequency

25MHz±50ppm

20.000372MHz

PASS

Dutycycle

45%~55%

48.92%~52.02%

PASS

Width

18~22ns

19.318~20.831ns

PASS

WidthN

18~22ns

19.217~20.610ns

PASS

X2

Monotonic

Monotonic

Monotonic

PASS

Frequency

66.666MHz±

50ppm

66.66607MHz

PASS

Dutycycle

45%~55%

50.79%~51.77%

PASS

Width

6.7~8.2ns

7.619~7.775ns

PASS

WidthN

6.7~8.2ns

7.230~7.382ns

PASS

X3

Monotonic

Monotonic

Monotonic

PASS

Frequency

25.000125MHz±

50ppm

24.999628MHz

PASS

Dutycycle

45%~55%

48.65%~49.33%

PASS

Width

17.9~21.9ns

19.392ns~19.752

PASS

WidthN

17.9~21.9ns

20.285~20.646ns

PASS

Testlog

Y1:

X2:

X3:

Powerconsumption

OverallConsumptionTest

HardwareEquipment

Oscilloscope:LeCroy620Zi;Dataanalysis:Nustreams-600I;ACsource:CXTECH61020.

Testtopology

DUTFullLoadSetup

DUTEth1&Eth8,SFP1&SPF12connecttoNuStreams,PortsSetupasbelow:

SAPort

DAPort

Stream

Length(byte)

Eth1(VLAN11)

Eth2(VLAN11)

1000Mbps*100%

Random

Eth2(VLAN11)

Eth3(VLAN12)

1000Mbps*100%

Random

Eth3(VLAN12)

Eth4(VLAN12)

1000Mbps*100%

Ran