




版權說明:本文檔由用戶提供并上傳,收益歸屬內(nèi)容提供方,若內(nèi)容存在侵權,請進行舉報或認領
文檔簡介
半導體詞匯縮寫表
A/Danalogtodigital
AAatomicabsorption
AASatomicabsorptionspectroscopy
ABCactivity-basedcosting
ABMactivity-basedmanagement
ACalternatingcurrent;activatedcarbon
ACFanisotropicconductivefilm
ACIafter-cleaninspection
ACPanisotropicconductivepaste
ACTalternativecontroltechniques;actualcycletime
ADCanalog-to-digitaiconverter
ADEadvanceddevelopmentenvironment
ADIafter-developinspection
ADTapplieddiagnostictechnique
ADTSEMApply/DevelopTrackSpecificEquipmentModel
AEatomicemission;acousticemission;absoluteellipsometry
AECadvancedequipmentcontroller
AECSAdvancedEquipmentControlSystem;AutomatedEquipmentControlSystem
AEIafter-etchinspection;automatedequipmentinterface
AEManalyticalelectronmicroscopy
AESAugeremission/electronspectroscopy
AFMatomicforcemicroscopy
AFPabrasive-freepolish
Agsilver
A-GEMTFAdvancedGEMTaskForce
AGVautomatedguidedvehicle
AHFanhydroushydrogenfluoride
AHUairhandlingunit
AIRautomatedimageretrieval
Alaluminum
ALDatomiclayerdeposition
ALEatomiclayerepitaxy;applicationlogicelement
ALSadvancedlightsource;advancedlow-powerSchottky
AMCairbornemolecularcontamination
AMHSautomatedmaterialhandlingsystem
AMTadvancedmanufacturingtechnology
AMUatomicmassunit
ANNartificialneuralnetwork
ANOVAanalysisofvariance
AOVair-operatedvalve
APadhesionpromoter
APAadvancedperformancealgorithm
APCadvancedprocesscontrol
APCDadd-onpollutioncontroldevice
APCFIAdvancedProcessControlFrameworklnitiative
APCVDatmosphericpressurechemicalvapordeposition
APECadvancedprocessequipmentcontrol
APIapplicationprogramminginterface;atmosphericpressureionization
APMatmosphericpassivationmodule;acousticplatemode
APRDLAdvancedProductsResearchandDevelopmentLaboratory
aPSMattenuatingphase-shiftmask
AQIACCESSqueryinterface
AQLacceptablequalitylevel
Arargon
ARaspectratio
ARAMSAutomatedRellability
ARCantireflectivecoating
ARDEaspectratio-dependentetching
ARPAAdvancedResearchProjectsAgency(seeDARPA)
ARSangle-resolvedscattering
Asarsenic
AS/RSautomatedstorageandretrievalsystem
ASAPAdvancedStepperApplicationProgram
ASICapplication-specificintegratedcircuit
ASOautomaticshutoff
ASPadvancedstripandpassivation;advancedstripprocessor
ASRautomatedsendreceive
ATDFAdvancedToolDeve1opmentFacility
ATEautomatictestequipment
ATGautomatictestgeneration
ATLASabbreviatedtestlanguageforallsystems
atmatmosphere
ATPadvancedtechnologyprogram;adenosinetriphosphate;acceptanceandtoolperformance
ATRattenuatedtotalreflectance
Attattenuated
Augold
AVPadvancedverticalprocessor
AVSadvancedvisualizationsystem
AWEasymptoticwaveformevaluation
AWISPMabovewaferinsituparticlemonitoring
AWSadvancedwetstation
Bbi11ion;boron
Babarium
BARCbottomantireflectivecoating
BASEBostonAreaSemiconductorEducation(Council)
BAWbulkacousticwave
BCbiascontrast
BDEVbehavior-leveldeviation
BDSBrownianDynamicsSimulation
Beberyllium
BEOLbackendofline
BESOIbondedandetchbacksilicononinsulator
BFbrightfield
BFGSBroyden-Fletcher-Goldfarb-Shannooptimizationalgorithm
BFLbufferedfield-effecttransistorlogic
BGAballgridarray
BHTBrinellhardnesstest
Bibismuth
BiCMOSbipolarcomplementarymetal-oxidesemiconductor
BIFETbipolarfield-effecttransistor
BIMbinaryintensitymask
BiMOSbipolarmetal-oxidesemiconductor
BISTbuilt-inself-test
BITbulkiontemperature
BITEbuilt-intestequipment
BMCbubb1ememorycontrol1er
BMDbulkmicrodefect
BOEbufferedoxideetchant
BORbottomofrange
BOSSBookofSEMIStandards;binaryobjectstoragesystem
BOXburiedoxide
BPRbeamprofi1ereflectometry;businessprocessreengineering
BPSGboronphosphosilicateglass
BPTEOSBPSGfromaTEOSsource
Brbromine
BSEbackseatteredelectrondetection
BTABbumpedtapeautomatedbonding
BVbreakdownvoltage
Ccarbon
Cacalcium
CACIMarchitecture
CAACIMapplicationsarchitecture
CABCompetitiveAnalysisBenchmarking
CADcomputer-aideddesign
CADTcontrolapplicationdevelopmenttool
CAEcomputer-aidedengineering
CAIcomputer-assistedinstruction
CAMcomputer-aidedmanufacturing
CAPScomputer-assistedproblemsolving
CARchemicallyamplifiedresist
CARRIComputerizedAssessmentofRelativeRiskimpacts
CASEcomputer-aidedsoftwareengineering;computer-aidedsystemsengineering
CATcomputer-aidedtesting
CAWConstruct!onAnalysisWorkgroup
CAWCcryogenicaerosolwafercleaning
CBGAceramicbalIgridarray
CBSchemicalbottlestoragearea
CBTcomputer-basedtraining
CCchipcarrier;clustercontroller
CCCceramicchipcarrier
CCDcharge-coupleddevice
CCSLcompatiblecurrent-sinkinglogic
CCWcounterclockwise
Cdcadmium
CDcriticaldimension
CD/OLcriticaldimensionoverlay
CDAcleandryair
CDEchemicaldownstreametch
CDEMCustomerDeliveryEnterpriseMode1
CDIcollector-diffusionisolation
CDMCommonDeviceMode1forSAB
CDOcontro11eddecomposition/oxidation
CDRchemicaldistributionroom
CDSchemicaldistributionsystem
Cecerium
CEcapillarye1ectrophoresis
CECcellevaluationchip
CEEcontrolexecutionenvironment
CEMcontinuousemissionsmonitoring
CER-DIPceramicdualin-linepackage
CFAcomponentfailureanalysis
CFCchlorofluorocarbon
CFDcomputationalfluiddynamics
CFMcontamination-freemanufacturing
CICcleanroominterfacechamber
CIDcharge-injectiondevice
CIEcomputer-integratedengineering
CIMcomputer-integratedmanufacturing
CIM-OSAcomputer-integratedmanufacturing-opensystemsarchitecture(ESPRITprogram)
CIPContinuousImprovementProgram
CISCenterforlntegratedSystems
CISCcomplexinstructionsetcomputer
Clchlorine
CLCCceramicleadedchipcarrier
CLICclosed-loopintensitycontrol
CMconfigurationmanagement;cassettemodule
CMCcassettemodulecontroller
CMLcurrentmodelogic
CMMcapabilitymaturitymodel
CMOScomplementarymetal-oxidesemiconductor
CMPchemicalmechanicalplanarization
CMRcommon-moderejectionratio;cancelmoverequest
CNCcomputernumericalcontrol;condensationnucleuscounter
CNTcarbonnanotube
Cocobalt
COBchip-on-board
COCcostofconsumables
CODECcoder-decoder
COEDcomputer-optimizedexperimentaldesign
COGScostofgoodssold
CoOcostofownership
CORBAcommonobjectrequestbrokerarchitecture
COREcompositeobjectreference
COSScommonobjectservicesspecification
COTcustomer-ownedtooling
CoVcoefficientofvariance
Cpprocesscapability
CPDconcurrentproductdevelopment
CPECommunications
CPGAceramicpingridarray
Cpkprocesscapabilityindex
CQFPceramicquadflatpack
CQNclosed-queuingnetwork
Crchromium
CRCcyclicredundancycheck
CRMCost/ResourceModel
Cscesium
CSACIMsystemsarchitecture
CSEcontrolsystemsengineering
CSFcriticalsuccessfactor
CSLcurrent-steeringlogic
CSMA/CDcarrier-sense
CSPchip-sealepackage
CSPEDconcurrentsemiconductorproductionandequipmentdevelopment
CSTCIMsystemstechnology
CSTRcontinuouslystirredtankreactor
CSVcomma-separatedvariable
CTCclustertoolcontroller
CTEcoefficientofthermalexpansion
CTIeyeletimeimprovement
CTMCclustertoolmodularcommunications
Cucopper
CUBcentralutilitybuilding
CUBEScapacityutilizationbottleneckefficiencysystem
CUIcommonuserinterface
CUSUMcumulativesum
CVcapacitance-to-voltage
CVCMcollectedvolatilecondensablematerials
CVDchemicalvapordeposition
CWcontinuouswave
CzCzochralskiprocess
D/Adigitaltoanalog
D/Bdiebonding
DACdigital—to—analogconverter
DASdirectabsorptionspectroscopy
DASSLdifferentialalgebraicsystemsolver
DBMSdatabasemanagementsystem
DCdirectcurrent
DCAdirectchipattachment
DCATSdouble-containedacidtransfersystem
DCEdistributedcomputerenvironment
DCLdigitalcommandlanguage;displaycommunicationlog
DCSdichlorosilane
DDLdevicedescriptionlanguage
DDMSdefeetdatamanagementsystem
DEDSdiscrete-eventdynamicsimulation
DESdataencryptionstandard;displayequipmentstatus
DFdarkfield
DFCdensifiedfluidclean
DFEdual-frequencyetch
DFMdesignformanufacturing
DFRdesignforreliability
DFTdesignfortest
DFYdesignforyield
DHFdilutehydrofluoricacid
DIdeionized;dielectricisolation
DIBLdrain-inducedbarrierleakage
DICdifferentialinterferencecontrast
DILdualin-line
DIPdualin-linepackage
DLBIdevice—levelburn—in
DLOCdevelopedsourcelinesofcode
DLSdisplaylotstatus
DLTdevice-leveltest
DLTSdeep-leveltransientspectroscopy
DMAdirectmemoryaccess;dynamicmechanicalanalysis
DMHdisplaymessagehelps
DMLdatamanipulationlanguage;displaymessagelog
DMMdigitalmultimeter
DMOSdiffusedmetal-oxidesemiconductor
DMRdisplaymoverequests
DOdynamicoptimization
DOAdead-onalignment
DOASdifferentialopticalabsorptionspectroscopy
DOEdesignofexperiments
DOFdepthoffocus
DOPdioctylphthalate
DPAdestructivephysicalanalysis
DPMdigitalpanelmeter
DPPdischarge-producedplasma
DPSRAMdual-portstaticrandomaccessmemory
DRAMdynamicrandomaccessmemory
DRAPACDesignRuleandProcessArchitectureCounci1
DRCdesignrulecheck
DREdestructionremovalefficiency
DRIFTSdiffusereflectanceinfraredFouriertransformspectroscopy
DRTdefectreviewtool
DSAdisplaysystemactivity;dimensionallystableanode
DSCdifferentialscanningcalorimetry
DSMCdirectsimulationMonteCarlo
DSQdownstreamquartz
DSSdisplaystockerstatus
DSWdirectstep-on-wafer
DTdynamictest
DTAdifferentialthermalanalysis
DTCdirectthermocouplecontrol
DTLdiodetransistorlogic
DTMdefecttestmonitor;delaytimemultiplier;devicetestmodule;digitalterrainmap
DTMPNdefecttestmonitorphasenumber
DUTdeviceundertest
DUVdeepultraviolet
DVdesignverification
DVERdesignruleverification
DVMdigitalvoltmeter
DVSdisplayvehiclestatus
DWGdomainworkgroup
EAPSMembeddedattenuatedphase-shiftmask
EAROMelectricallyalterableread-onlymemory
EASEequipmentandsoftwareemulator
e-beamelectronbeam
EBHTe1ectron-beamhigh-throughput1ithography
EBICelectronbeam-inducedcurrent
EBRedgebeadremoval
ECengineeringchange;equipmentcontroller
ECAengineeringcapabilityassessment
ECADelectroniccomputer-aideddesign;engineeringcomputer-aideddesign
ECAEelectroniccomputer-aidedengineering
ECLemittercoupledlogic
ECNengineeringchangenotice
ECOengineeringchangeorder
ECQBelectrochemicalquartzcrystalbalance
ECRelectroncyclotronresonance
EDAelectronicdesignautomation
EDSenergy-dispersivespectroscopy
EDUequipment-dependentuptime
EDXenergy-dispersiveX-ray
EDXAenergy-dispersiveX-rayanalysis
EEDFelectronenergydistributionfunction
EELSelectronenergy-lossspectroscopy
EEPROMelectricallyerasableprogrammableread-onlymemory
EFEMequipmentfront-endmodule
EFOCSevanescentfiber-opticchemicalsensor
EFTIRemissionFouriertransforminfraredspectroscopy
EFVexcessflowvalve
EGEethyleneglycolethers
EHSextremelyhazardoussubstance
EIequipmentintegralion
EIDEquipmentInterfaceDevelopment
EIPEquipmentImprovementProgram;EquipmentImprovementProject
EISelectrochemicalimpedancespectroscopy
EKFextendedKalmanfiIter
ELFextremelylowfrequency
EMenterprisemodel;electromagnetic;e1ectromigration
EMAequipmentmaturityassessment
EMCelectromagneticcapability;electromagneticcompatability
EMFelectromagneticfield
EMGelectromigration
EMIelectromagneticinterference
EMMAe1ectronmicroscopyandmicroanalysis
EMPelectromagneticpulse
EMRentermoverequest
EMUelectromagneticunit
EOSelectricaloverstress
EOTendoftransfer;equivalentoxidethickness
EPextremepressure;electropolish
EPLelectronprojectionlithography
EPRelectronparamagneticresonance
EPROMelectricallyprogrammab1eread-onlymemory
EPSSelectronicperformancesupportsystem
EPTequipmentperformancetracking
EQUIPC/Iequipmentcontrolandintegration
EQUIPRTCequipmentreal-timecontrol
ERAMequipmentreliability
ERMenterprisereferencemodel
ERNexternalrecurrentneuralnetwork
ERPextendedrangepyrometer
ERSeventreportingstandard
ERTemergencyresponsetime
ESengineeringspecification;expertsystem
ESCelectrostaticchuck
ESCAelectronspectroscopyforchemicalanalysis
ESDelectrostaticdischarge
ESHenvironment
ESMelectronicservicemanual
ETABExecutiveTechnicalAdvisoryBoard
ETQRExternalTotalQualityandReliability
EUVextremeultraviolet
eVelectronvolt
EWMAexponentiallyweightedmovingaverage
Ffluorine
F/Ifinalinspection
FAfailureanalysis
FABfastatombombardment
FAMOSfloating-gateavalanche-injectionmetal-oxidesemiconductor
FBGAfine-pitchbal1gridarray
FCflipchip
FCMfacilitiescostmodel
FCSfactorycontrolsystem
FDCfaultdetectionandclassification
FDEfrequencydomainexperiments
FDSOIfullydepletedsilicononinsulator
Feiron
FECfabricationevaluationchip
FEMfiniteelementmodel
FEOLfrontendofline
FESEMfieldemissionscanningelectronmicroscopy
FETfield-effecttransistor
FFTfastFouriertransform
FFUfilterfanunit
FIfilterabilityindex;factoryintegration
FIBfocusedionbeam
FIDflameionizationdetector
FIFOfirst-in
FIMSfront-openinginterfacemechanicalstandard
FLfuzzylogic
FLOPCfloatingpointoperationsneededpercycle
FLOTOXfloatinggatetunneloxide
FLRTfactorylayout/relayouttool
FMforeignmaterial
FMEAfailuremodeandeffectsanalysis
FMMCfactorymaterialmovementcomponent
FMVPFrameworkMemberValidationProject
FNNfeed-forwardneuralnetwork
FOCSfiber-opticchemicalsensor
FOSBfrontopeningshippingbox
FOUPfrontopeningunifiedpod
FOVfieldofview
FOXfieldoxide
FPflashpoint
FPDfocalplanedeviation;flatpan
溫馨提示
- 1. 本站所有資源如無特殊說明,都需要本地電腦安裝OFFICE2007和PDF閱讀器。圖紙軟件為CAD,CAXA,PROE,UG,SolidWorks等.壓縮文件請下載最新的WinRAR軟件解壓。
- 2. 本站的文檔不包含任何第三方提供的附件圖紙等,如果需要附件,請聯(lián)系上傳者。文件的所有權益歸上傳用戶所有。
- 3. 本站RAR壓縮包中若帶圖紙,網(wǎng)頁內(nèi)容里面會有圖紙預覽,若沒有圖紙預覽就沒有圖紙。
- 4. 未經(jīng)權益所有人同意不得將文件中的內(nèi)容挪作商業(yè)或盈利用途。
- 5. 人人文庫網(wǎng)僅提供信息存儲空間,僅對用戶上傳內(nèi)容的表現(xiàn)方式做保護處理,對用戶上傳分享的文檔內(nèi)容本身不做任何修改或編輯,并不能對任何下載內(nèi)容負責。
- 6. 下載文件中如有侵權或不適當內(nèi)容,請與我們聯(lián)系,我們立即糾正。
- 7. 本站不保證下載資源的準確性、安全性和完整性, 同時也不承擔用戶因使用這些下載資源對自己和他人造成任何形式的傷害或損失。
最新文檔
- 2025-2030年中國熱轉(zhuǎn)印碳帶行業(yè)發(fā)展狀況及投資規(guī)劃研究報告
- 2025-2030年中國濾清器制造行業(yè)市場需求狀況及發(fā)展策略分析報告
- 2025-2030年中國汽車鑄造市場發(fā)展趨勢規(guī)劃分析報告
- 2025-2030年中國桶裝水行業(yè)運行狀況及發(fā)展趨勢分析報告
- 小區(qū)監(jiān)控報價合同范本
- 2025-2030年中國柑橘油香料行業(yè)運行動態(tài)與發(fā)展戰(zhàn)略分析報告
- 2025-2030年中國木本油料市場供需現(xiàn)狀及投資發(fā)展規(guī)劃研究報告
- 2025-2030年中國打字機市場未來發(fā)展趨勢及前景調(diào)研分析報告
- 2025-2030年中國手機uv涂料行業(yè)運行態(tài)勢及發(fā)展風險分析報告
- 2025-2030年中國干散貨運輸市場運行態(tài)勢及發(fā)展規(guī)劃分析報告
- 上海市建設工程施工圖設計文件勘察設計質(zhì)量疑難問題匯編(2024 版)
- 地理-浙江省杭州八縣市2024學年高二第一學期期末學業(yè)水平測試試題和答案
- 《康復工程學》課件-第一講 康復工程概論
- 2025年度智慧醫(yī)療服務平臺建設合同范本
- 2024項目管理人員安全培訓考試題(審定)
- 2025四川宜賓市高縣縣屬國企業(yè)第一次招聘3人易考易錯模擬試題(共500題)試卷后附參考答案
- 2024 年國家公務員考試《申論》(地市級)真題及答案
- 南京2025年中國醫(yī)學科學院皮膚病醫(yī)院招聘13人第二批筆試歷年典型考點(頻考版試卷)附帶答案詳解
- 2024年沈陽職業(yè)技術學院高職單招語文歷年參考題庫含答案解析
- 《榜樣9》觀后感心得體會一
- 2024年上海普陀區(qū)司法局招聘人民調(diào)解員考試真題
評論
0/150
提交評論