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Advance
FLASHMEMORY
K9LAG08U1MK9G8G08U0M
PAGE
10
K9XXG08UXM
INFORMATIONINTHIS
ISPROVIDEDINRELATIONTOSAMSUNGPRODUCTS,
ANDISSUBJECTTOCHANGEWITHOUTNOTICE.
NOTHINGINTHIS
SHALLBECONSTRUEDASGRANTINGANYLICENSE,
EXPRESSORIMPLIED,BYESTOPPELOROTHERWISE,
TOANYIN LECTUALPROPERTYRIGHTSINSAMSUNGPRODUCTSORTECHNOLOGY.ALLINFORMATIONINTHIS ISPROVIDED
ONAS"ASIS"BASISWITHOUTGUARANTEEORWARRANTYOFANYKIND.
ForupdatesoradditionalinformationaboutSamsungproducts,contactyournearestSamsungoffice.
Samsungproductsarenotintendedforuseinlifesupport,criticalcare,medical,safetyequipment,orsimilarapplicationswhereProductfailurecouldresultinlossoflifeor alorphysicalharm,oranymilitaryordefenseapplication,oranyernmentalprocurementtowhichspecialtermsorprovisionsmayapply.
*SamsungElectronicsreservestherighttochangeproductsorspecificationwithoutnotice.
Title
1Gx8Bit/2Gx8BitNANDFlashMemory
RevisionHistory
RevisionNo
History
DraftDate
Remark
0.0
0.1
0.2
0.3
0.4
0.5
Initialissue
Cycletimeischangedfrom35nsto30ns
Technicalnoteischanged.
ACPara.tRHWdeleted
thepowerrecoverytimeofminmumischangedfrom10sto100s(p38)
Leadedpartiseliminated.
tR50us->60us(p.3,12,31)
tRHW,tCSDparameterisdefined.
Technicalnoteisadded.(p.16)
Enduranceischanged(10K->5K)
Max.tPROGischanged(2ms->3ms)
Feb.1st2005
Apr.1st2005
Sept.1.2005
Mar.20th.2006
Apr.20th2006
Apr.25th2006
AdvanceAdvance
Advance
Advance
AdvanceAdvance
TheattacheddatasheetsarepreparedandapprovedbySAMSUNGElectronics.SAMSUNGElectronicsCO.,.reservetherighttochangethespecifications.SAMSUNGElectronicswillevaluateandreplytoyourrequestsandquestionsaboutdevice.Ifyouhaveanyquestions,pleasecontacttheSAMSUNGbranchofficenearyouroffice.
1Gx8Bit/2Gx8BitNANDFlashMemory
PRODUCTLIST
PartNumber
VccRange
Organization
PKGType
K9G8G08U0M-P
2.7V~3.6V
X8
TSOP1
K9G8G08U0M-I
52ULGA
K9LAG08U1M-I
FEATURES
VoltageSupply:2.7V~3.6V
Organization
MemoryCellArray:(1G+32M)bitx8bit
DataRegister :(2K+64)bitx8bit
AutomaticProgramandErase
PageProgram:(2K+64)Byte
BlockErase :(256K+8K)Byte
PageReadOperation
PageSize:(2K+64)Byte
RandomRead:60s(Max.)
SerialAccess:30ns(Min.)
MemoryCell:2bit/MemoryCell
FastWriteCycleTime
Programtime:800s(Typ.)
BlockEraseTime:1.5ms(Typ.)
Command/Address/DataMultiplexedI/OPort
HardwareDataProtection
-Program/EraseLockoutDuringPowerTransitions
ReliableCMOSFloating-GateTechnology
Endurance:5KProgram/EraseCycles(with4bit/512byteECC)
DataRetention:10Years
CommandRegisterOperation
UniqueIDforCopyrightProtection
Package:
K9G8G08U0M-PCB0/PIB0:Pb-PACKAGE
48-PinTSOPI(12x20/0.5mmpitch)
K9G8G08U0M-ICB0/IIB0
52-PinULGA(12x17/1.00mmpitch)
K9LAG08U1M-ICB0/IIB0
52-PinULGA(12x17/1.00mmpitch)
GENERALDESCRIPTION
Offeredin1Gx8bit,theK9G8G08U0Misa8G-bitNANDFlashMemorywithspare256M-bit.ItsNANDcellprovidesthemostcost-effectivesolutionforthesolidstatemassstoragemarket.Aprogramoperationcanbeperformedintypical800sonthe2,112-bytepageandaneraseoperationcanbeperformedintypical1.5msona(256K+8K)byteblock.Datainthedataregistercanbereadoutat30nscycletimeperbyte.TheI/Opinsserveastheportsforaddressanddatainput/outputaswellascommandinput.Theon-chipwritecontrollerautomatesallprogramanderasefunctionsincludingpulserepetition,whererequired,andinternalverificationandmarginingofdata.Eventhewrite-intensivesystemscantakeadvantageoftheK9G8G08U0Mtendedreliabilityof5Kprogram/erasecyclesbyprovidingECC(ErrorCorrectingCode)withrealtimemap-outalgorithm.TheK9G8G08U0Misanoptimumsolu-tionforlargenonvolatilestorageapplicationssuchassolidstatefilestorageandotherportableapplicationsrequiringnon-volatility.
PINCONFIGURATION(TSOP1)
K9G8G08U0M-PCB0/PIB0
N.C
N.C
N.C
N.C
N.C
N.C
R/BRECEN.C
N.C
VccVssN.C
N.CCLEALEWEWPN.C
N.C
N.C
N.C
N.C
N.C
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
48-pinTSOP1
StandardType
12mmx20mm
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
N.C
N.C
N.CI/O7I/O6I/O5I/O4N.C
N.C
N.C
VccVssN.C
N.C
N.CI/O3I/O2I/O1I/O0N.C
N.C
N.C
N.C
0.16+0.07
-0.03
050
0.0197
0.008+0.003
-0.001
0.25TYP
0.010
0.125+0.075
0.035
0.005+0.003
-0.001
12.40MAX
0.488
12.00
0.472
(0.25)
0.010
PACKAGEDIMENSIONS
0.004MAX
0.10
Unit:mm/Inch
20.000.20
0.7870.008
#1
#48
#24
#25
1.000.05
0.0390.002
0.05MIN
0.002
18.400.10
0.7240.004
0.047
1.20MAX
0~8
0.45~0.750.018~0.030
(0.50)
0.020
48-TSOP1-1220AF
+0.07
0.20-0.03
48-PINLEAD/LEADSTICTHINSMALLOUT-LINEPACKAGETYPE(I)
17.000.10
1.00
0.50
1.00
2.50
12.00
1.30
1.00
2.50
0.65Max
2.00
17.000.10
PINCONFIGURATION(ULGA)
K9G8G08U0M-ICB0/IIB0
NC NC NC
NC NC NC
NC /RE NC NC NC NC NC
Vcc
NC Vss IO7 IO5 Vcc
/CE NC R/B NC IO6 IO4
NC
CLE
NC
/WE
IO0
IO2 Vss
NC
Vss NC /WP IO1 IO3 Vss
NC
ALE
NC
NC
NC
NC NC
NC NC NC
NC NC NC
ABCDEFGHJKLMN
7
6
5
4
3
2
1
52-ULGA(measuredinmillimeters)
12.000.10
1.0010.001.00
A
2.00
12.000.10
76543 2 1
B
(DatumA)
1.00
1.00
#A1
ABC
D
(DatumB)
E
F
GH
JKLM
N
12-1.000.05
0.1MCAB
41-0.700.05
17.000.10
0.10C
SideView
BottomView
TopView
PACKAGEDIMENSIONS
0.1MC
AB
17.000.10
1.00
0.50
1.00
2.50
12.00
1.30
1.00
2.50
0.65Max
2.00
17.000.10
K9LAG08U1M-ICB0/IIB0
ABCDEFGHJKLMN
NC
NC NC
NC
NC
NC
NC
/RE1 R/B2 IO7-2IO6-2 IO5-2
NC
Vcc
/RE2 Vss
IO7-1IO5-1 Vcc
/CE1 /CE2 R/B1 /WP2 IO6-1 IO4-1 IO4-2
CLE1
CLE2/WE1
IO0-1IO2-1 Vss
IO3-2
Vss ALE2 /WP1 IO1-1IO3-1 Vss
NC
ALE1
NC NC
/WE2
NC
IO0-2
IO1-2 IO2-2 NC
NC
NC
NC
7
6
5
4
3
2
1
52-ULGA(measuredinmillimeters)
12.000.10
1.0010.001.00
A
2.00
12.000.10
76543 2 1
B
(DatumA)
1.00
1.00
#A1
A
BC
(DatumB)
DEF
GH
JKLM
N
12-1.000.05
0.1MCAB
41-0.700.05
0.1MCAB
17.000.10
0.10C
SideView
BottomView
TopView
PACKAGEDIMENSIONS
PINDESCRIPTION
PinName
PinFunction
I/O0~I/O7
DATAINPUTS/OUTPUTS
TheI/Opinsareusedtoinputcommand,addressanddata,andtooutputdataduringreadoperations.TheI/Opinsfloattohigh-zwhenthechipisdeselectedorwhentheoutputsaredisabled.
CLE
COMMANDLATCHENABLE
TheCLEinputcontrolstheactivatingpathforcommandssenttothecommandregister.Whenactivehigh,commandsarelatchedintothecommandregisterthroughtheI/OportsontherisingedgeoftheWEsignal.
ALE
ADDRESSLATCHENABLE
TheALEinputcontrolstheactivatingpathforaddresstotheinternaladdressregisters.AddressesarelatchedontherisingedgeofWEwithALEhigh.
CE
CHIPENABLE
TheCEinputisthedeviceselectioncontrol.WhenthedeviceisintheBusystate,CEhighisignored,andthedevicedoesnotreturntostandbymodeinprogramoreraseoperation.RegardingCEcontrolduringreadoperation,referto’Pageread’sectionofDeviceoperation.
RE
READENABLE
TheREinputistheserialdata-outcontrol,andwhenactivedrivesthedataontotheI/Obus.DataisvalidtREAafterthefallingedgeofREwhichalsoincrementstheinternalcolumnaddresscounterbyone.
WE
WRITEENABLE
TheWEinputcontrolswritestotheI/Oport.Commands,addressanddataarelatchedontherisingedgeoftheWEpulse.
WP
WRITEPROTECT
TheWPpinprovidesinadvertentwrite/eraseprotectionduringpowertransitions.TheinternalhighvoltagegeneratorisresetwhentheWPpinisactivelow.
R/B
READY/BUSYOUTPUT
TheR/Boutputindicatesthestatusofthedeviceoperation.Whenlow,itindicatesthataprogram,eraseorrandomreadoperationisinprocessandreturnstohighstateuponcompletion.Itisanopendrainoutputanddoesnotfloattohigh-zconditionwhenthechipisdeselectedorwhenoutputsaredisabled.
V OWER
CCisthepowersupplyfordevice.
Vss
GROUND
N.C
NOCONNECTION
Leadisnotinternallyconnected.
NOTE:ConnectallVCCandVSSpinsofeachdevicetocommonpowersupplyoutputs.
DonotleaveVCCorVSSdisconnected.
Figure1-1.K9G8G08U0MFunctionalBlockDiagram
A12-A30
A0-A11
Command
I/OBuffers&Latches
VccVss
CEREWE
GlobalBuffers
I/
CLEALEWP
ControlLogic&HighVoltageGenerator
CommandRegister
Y-BuffersLatches
&Decoders
X-BuffersLatches
&Decoders
OutputDriver
8,192M+256MBit
NANDFlashARRAY
(2,048+64)Bytex524,288
DataRegister&S/A
Y-Gating
VccVss
I/00
07
Figure2-1.K9G8G08U0MArrayOrganization
(
512KPages(=4,096Blocks)
8bit
2KBytes
64Bytes
PageRegister
2KBytes
I/O0~I/O7
64Bytes
1Block=128Pages256K+8k)Byte
1Page=(2K+64)Bytes
1Block=(2K+64)Bx128Pages
=(256K+8K)Bytes
1Device=(2K+64)Bx128Pagesx4,096Blocks
=8,448Mbits
I/O0
I/O1
I/O2
I/O3
I/O4
I/O5
I/O6
I/O7
1stCycle
A0
A1
A2
A3
A4
A5
A6
A7
2ndCycle
A8
A9
A10
A11
*L
*L
*L
*L
3rdCycle
A12
A13
A14
A15
A16
A17
A18
A19
4thCycle
A20
A21
A22
A23
A24
A25
A26
A27
5thCycle
A28
A29
A30
*L
*L
*L
*L
*L
NOTE:ColumnAddress:StartingAddressoftheRegister.
Lmustbesetto"Low".
Thedeviceignoresanyadditionalinputofaddresscycleshanrequired.
ColumnAddressColumnAddressRowAddressRowAddressRowAddress
ProductIntroduction
TheK9G8G08U0Misa8,448Mbit(8,858,370,048bit)memoryorganizedas524,288rows(pages)by2,112x8columns.Spare64col-umnsarelocatedfromcolumnaddressof2,048~2,111.A2,112-bytedataregisterisconnectedtomemorycellarraysfor mo-datingdatatransferbetweentheI/Obuffersandmemorycellsduringpagereadandpageprogramoperations.Thememoryarrayismadeupof32cellsthatareseriallyconnectedtoformaNANDstructure.Eachofthe32cellsresidesinadifferentpage.AblockconsistsoftwoNANDstructuredstrings.ANANDstructureconsistsof32cells.Acellhas2-bitdata.Total1,081,344NANDcellsresideinablock.Theprogramandreadoperationsareexecutedonapagebasis,whiletheeraseoperationiecutedonablockbasis.Thememoryarrayconsistsof4,096separayerasable256K-byteblocks.Itindicatesthatthebitbybiseoperationispro-hibitedontheK9G8G08U0M.
TheK9G8G08U0Mhasaddressesmultiplexedinto8I/Os.Thisschemedramaticallyreducespincountsandallowssystemupgradestofuturedensitiesbymaintainingconsistencyinsystemboarddesign.Command,addressanddataareallwrittenthroughI/O'sbybringingWEtolowwhileCEislow.ThosearelatchedontherisingedgeofWE.CommandLatchEnable(CLE)andAddressLatchEnable(ALE)areusedtomultiplexcommandandaddressrespectively,viatheI/Opins.Somecommandsrequireonebuscycle.Forexample,ResetCommand,StatusReadCommand,etcrequirejustonecyclebus.Someothercommands,likepagereadandblockeraseandpageprogram,requiretwocycles:onecycleforsetupandtheothercycleforexecution.The1G-bytephysicalspacerequires30addresses,therebyrequiringfivecyclesforaddressing:2cyclesofcolumnaddress,3cyclesofrowaddress,inthatorder.PageReadandPageProgramneedthesamefiveaddresscyclesfollowingtherequiredcommandinput.InBlockEraseoper-ation,however,onlythreerowaddresscyclesareused.Deviceoperationsareselectedbywritingspecificcommandsintothecom-mandregister.Table1definesthespecificcommandsoftheK9G8G08U0M.
Table1.CommandSets
Function
1stCycle
2ndCycle
AcceptableCommandduringBusy
Read
00h
30h
ReadID
90h
-
Reset
FFh
-
O
PageProgram
80h
10h
Two-
nePageProgram(2)
80h 11h
81h 10h
BlockErase
60h
D0h
Two-neBlockErase
60h 60h
D0h
RandomDataInput(1)
85h
-
RandomDataOutput(1)
05h
E0h
ReadStatus
70h
O
NOTE:1.RandomDataInput/Outputcanbeexecutedinapage.
Anycommandbetween11hand81hisprohibitedexcept70handFFh.
Caution:AnyundefinedcommandinputsareprohibitedexceptforabovecommandsetofTable1.
ABSOLUTE UMRATINGS
Parameter
Symbol
Rating
Unit
VoltageonanypinrelativetoVSS
Vcc
-0.6to+4.6
V
Vin
-0.6to+4.6
Vi/o
-0.6toVcc+0.3(<4.6V)
TemperatureUnderBias
K9XXG08UXM-XCB0
Tbias
-10to+125
C
K9XXG08UXM-XIB0
-40to+125
StorageTemperature
K9XXG08UXM-XCB0
Tstg
-65to+150
C
K9XXG08UXM-XIB0
ShortCircuitCurrent
Ios
5
mA
NOTE:
MinimumDCvoltageis-0.6Voninput/outputpins.Duringtransitions,thislevelmayundershootto-2.0Vforperiods<30ns.
umDCvoltageoninput/outputpinsisVCC+0.3Vwhich,duringtransitions,mayovershoottoVCC+2.0Vforperiods<20ns.
PermanentdevicedamagemayoccurifABSOLUTEUMRATINGSareexceeded.Functionaloperationshouldberestrictedtotheconditionsasdetailedintheoperationalsectionsofthisdatasheet.Exposuretoabsolute umratingconditionsforextendedperiodsmayaffectreliability.
MENDEDOPERATINGCONDITIONS
(VoltagereferencetoGND,K9XXG08UXM-XCB0:TA=0to70C,K9XXG08UXM-XIB0:TA=-40to85C)
Parameter
Symbol
K9XXG08UXM
Unit
Min
Typ.
Max
SupplyVoltage
Vcc
2.7
3.3
3.6
V
SupplyVoltage
Vss
0
0
0
V
DCANDOPERATINGCHARACTERISTICS( mendedoperatingconditionsotherwisenoted.)
Parameter
Symbol
TestConditions
Min
Typ
Max
Unit
OperatingCurrent
PageReadwithSerialAccess
Icc1
tRC=30ns,CE=VIL,IOUT=0mA
-
15
30
mA
Program
Icc2
-
-
15
30
Erase
Icc3
-
-
15
30
Stand-byCurrent(TTL)
Isb1
CE=VIH,WP=0V/VCC
-
-
1
Stand-byCurrent(CMOS)
Isb2
CE=VCC-0.2,WP=0V/VCC
-
10
50
A
InputLeakageCurrent
Ili
VIN=0toVcc(max)
-
-
10
OutputLeakageCurrent
Ilo
VOUT=0toVcc(max)
-
-
10
InputHighVoltage
VIH(1)
-
0.8xVcc
-
VCC+0.3
V
InputLowVoltage,Allinputs
VL(1)
-
-0.3
-
0.2xVcc
OutputHighVoltageLevel
Voh
IOH=-400A
2.4
-
-
OutputLowVoltageLevel
Vol
IOL=2.1mA
-
-
0.4
OutputLowCurrent(R/B)
IOL(R/B)
VOL=0.4V
8
10
-
mA
NOTE:
VILcanundershootto-0.4VandVIHcanovershoottoVCC+0.4Vfordurationsof20nsorless.
TypicalvaluearemeasuredatVcc=3.3V,TA=25C.Not100%tested.
ThetypicalvalueoftheK9LAG08U1M’sISB2is20Aandthe umvalueis100A.
VALIDBLOCK
Parameter
Symbol
Min
Typ.
Max
Unit
K9G8G08U0M
Nvb
3,996
-
4,096
Blocks
K9LAG08U1M
Nvb
7,992
8,192
Blocks
NOTE:
Thedevicemayincludeinitialinvalidblockswhenfirstshipped.Additionalinvalidblocksmaydevelopwhilebeingused.Thenumberofvalidblocksispresentedwithbothcasesofinvalidblocksconsidered.Invalidblocksaredefinedasblocksthatcontainoneormorebadbits.Donoseorpro-gramfactory-markedbadblocks.Refertotheattachedtechnicalnotesforappropriatemanagementofinitialinvalidblocks.
The1stblock,whichiscedon00hblockaddress,isguaranteedtobeavalidblockatthetimeofshipment.
Thenumberofvalidblockisonthebasisofsingleneoperations,andthismaybedecreasedwithtwoneoperations.
*:EachK9G8G08U0MchipintheK9LAG08U1Mhas un100invalidblocks.
ACTESTCONDITION
(K9XXG08UXM-XCB0:TA=0to70C,K9XXG08UXM-XIB0:TA=-40to85C)
Parameter
K9XXG08UXM
InputPulseLevels
0VtoVcc
InputRiseandFallTimes
5ns
InputandOutputTimingLevels
Vcc/2
OutputLoad
1TTLGATEandCL=50pF
CAPACITANCE(TA=25C,VCC=3.3V,f=1.0MHz)
Item
Symbol
TestCondition
Min
Max
Unit
Input/OutputCapacitance
Ci/o
VIL=0V
-
10
pF
InputCapacitance
Cin
VN=0V
-
10
pF
NOTE:Capacitanceisperiodicallysampledandnot100%tested.
MODESELECTION
CLE
ALE
CE
WE
RE
WP
Mode
H
L
L
H
X
ReadMode
CommandInput
L
H
L
H
X
AddressInput(5clock)
H
L
L
H
H
WriteMode
CommandInput
L
H
L
H
H
AddressInput(5clock)
L
L
L
H
H
DataInput
L
L
L
H
X
DataOutput
X
X
X
X
H
X
DuringRead(Busy)
X
X
X
X
X
H
DuringProgram(Busy)
X
X
X
X
X
H
DuringErase(Busy)
X
X(1)
X
X
X
L
WriteProtect
X
X
H
X
X
0V/Vcc(2)
Stand-by
NOTE:1.XcanbeVILorVIH.
2.WPshouldbebiasedtoCMOShighorCMOSlowforstandby.
Program/EraseCharacteristics
Parameter
Symbol
Min
Typ
Max
Unit
ProgramTime
tPROG
-
0.8
3
ms
DummyBusyTimeforMultineProgram
tDBSY
0.5
1
s
NumberofPartialProgramCyclesintheSamePage
Nop
-
-
1
cycle
BlockEraseTime
tBERS
-
1.5
10
ms
NOTE:Typicalprogramtimeisdefinedasthetimewithinwhi orethan50%ofthewholepagesareprogrammedat3.3VVccand25Ctemperature.
ACTimingCharacteristicsforCommand/Address/DataInput
Parameter
Symbol
Min
Max
Unit
CLESetupTime
tCLS(1)
15
-
ns
CLEHoldTime
tCLH
5
-
ns
CESetupTime
tCS(1)
20
-
ns
CEHoldTime
tCH
5
-
ns
WEPulseWidth
tWP
15
-
ns
ALESetupTime
tALS(1)
15
-
ns
ALEHoldTime
tALH
5
-
ns
DataSetupTime
tDS(1)
15
-
ns
DataHoldTime
tDH
5
-
ns
WriteCycleTime
tWC
30
-
ns
WEHighHoldTime
tWH
10
-
ns
AddresstoDataLoadingTime
tADL(2)
70(2)
ns
NOTES:1.ThetransiionofhecorrespondingcontrolpinsmustoccuronlyoncewhileWEisheldlow.
2.tADListhetimefromtheWErisingedgeoffinaladdresscycletotheWErisingedgeoffirstdycle.
ACCharacteristicsforOperation
Parameter
Symbol
Min
Max
Unit
DataTransferfromCelltoRegister
tR
-
60
s
ALEtoREDelay
tAR
10
-
ns
CLEtoREDelay
tCLR
10
-
ns
ReadytoRELow
tRR
20
-
ns
REPulseWidth
tRP
15
-
ns
WEHightoBusy
tWB
-
100
ns
ReadCycleTime
tRC
30
-
ns
REAccessTime
tREA
-
20
ns
CEAccessTime
tCEA
-
25
ns
REHightoOutputHi-Z
tRHZ
-
100
ns
CEHightoOutputHi-Z
tCHZ
-
30
ns
CEHightoALEorCLEDon’tCare
tCSD
10
-
ns
REHightoOutputHold
tRHOH
15
-
ns
RELowtoOutputHold
tRLOH
5
-
ns
CEHightoOutputHold
tCOH
15
-
ns
REHighHoldTime
tREH
10
-
ns
OutputHi-ZtoRELow
tR
0
-
ns
REHightoWELow
tRHW
100
-
ns
WEHightoRELow
tWHR
60
-
ns
DeviceResettingTime(Read/Program/Erase)
tRST
-
5/10/500(1)
s
NOTE:1.Ifresetcommand(FFh)iswrittenatReadystate,thedevicegoesintoBusyfor um5s.
NANDFlashTechnicalNotes
InitialInvalidBlock(s)
InitialinvalidblocksaredefinedasblocksthatcontainoneormoreinitialinvalidbitswhosereliabilityisnotguaranteedbySamsung.Theinformationregardingtheinitialinvalidblock(s)iscalledtheinitialinvalidblockinformation.Deviceswithinitialinvalidblock(s)havethesamequalitylevelasdeviceswithallvalidblocksandhavethesameACandDCcharacteristics.Aninitialinvalidblock(s)doesnotaffecttheperformanceofvalidblock(s)becauseitisisolatedfromthebitlineandthecommonsourcelinebyaselecttran-sistor.Thesystemdesignmustbeabletomaskouttheinitialinvalidblock(s)viaaddressmap.The1stblock,whichiscedon00hblockaddress,isguaranteedtobeavalidblockatthetimeofshipment.
IdentifyingInitialInvalidBlock(s)
Alldevicelocationsareerased(FFh)exceptlocationswheretheinitialinvalidblock(s)informationiswrittenpriortoship.Theinitialinvalidblock(s)statusisdefinedbythe1stbyteinthesparearea.Samsungmakessurethatthelastpageofeveryinitialinvalidblockhasnon-FFhdataatthecolumnaddressof2,048.Theinitialinvalidblockinformationisalsoerasableinmostcases,anditisimpossibletorecovertheinformationonceithasbeenerased.Therefore,thesystemmustbeabletorecognizetheinitialinvalidblock(s)basedontheinitialinvalidblockinformationandcreatetheinitialinvalidblocktableviathefollowingsuggestedflowchart(Figure3).Anyintentionalerasureoftheinitialinvalidblockinformationisprohibited.
IncrementBlockAddress
Check"FFh"atthecolumnaddress2048ofthelastpageintheblock
Create(orupdate)Initial
InvalidBlock(s)Table
*
No
Check"FFh"?
Yes
No LastBlock?
Yes
End
Start
SetBlockAddress=0
Figure3.Flowcharttocreateinitialinvalidblocktable.
NANDFlashTechnicalNotes()
Errorinwriteorreadoperation
Withinitslifetime,additionalinvalidblocksmaydevelopwithNANDFlashmemory.Refertothequalificationreportfortheactualdata.Blockrecementshouldbedoneuponeraseorprogramerror.
FailureMode
DetectionandCountermeasuresequence
Write
EraseFailure
StatusReadafterErase-->BlockRecement
ProgramFailure
StatusReadafterProgram-->BlockRecement
Read
UptoFourBitFailure
VerifyECC->ECCCorrection
ECC :ErrorCorrectingCode-->RSCodeetc.
Example)4bitcorrection/512-byte
Start
ProgramFlowChart
Write80h
WriteAddress
WriteData
Write10h
I/O6=1?
orR/B=1?
No
*
ProgramError
Yes
No
I/O0=0?
Yes
ProgramCompleted
ReadStatusRegister
*
:Ifprogramoperationresultsinanerror,mapouttheblockincludingthepageinerrorandcopythetargetdatatoanotherblock.
NANDFlashTechnicalNotes()
EraseFlowChart
I/O6=1?
orR/B=1?
No
*
EraseError
Yes
No
I/O0=0?
Yes
EraseCompleted
ReadStatusRegister
WriteD0h
WriteBlockAddress
Start
Write60h
Start
ReadFlowChart
Write00h
WriteAddress
Write30h
ReadData
ECCGeneration
*
No
ReclaimtheError
VerifyECC
Yes
PageReadCompleted
:Iferaseoperationresultsinanerror,mapout
thefailingblockandreceitwithanotherblock.
BlockRecement
BlockA
1st
(n-1)thnth
(page)
1st
(n-1)thnth
(page)
BlockB
1
anerroroccurs.
Buffermemoryofthecontroller.
2
Step1
WhenanerrorhappensinthenthpageoftheBlock’A’duringeraseorprogramoperation.
Step2
Copythedatainthe1st~(n-1)thpagetothesamelocationofanotherblock.(Block’B’)
Step3
Then,copythenthpagedataoftheBlock’A’inthebuffermemorytothenthpageoftheBlock’B’.
Step4
DonoseorprogramtoBlock’A’bycreatingan’invalidblock’tableorotherappropriatescheme.
NANDFlashTechnicalNotes()
Addressingforprogramoperation
Withinablock,thepagesmustbeprogrammedconsecutivelyfromtheLSB(leastsignificantbit)pageoftheblocktoMSB(mostsig-nificantbit)pagesoftheblock.Randompageaddressprogrammingisprohibited.Inthiscase,thedefinitionofLSBpageistheLSBamongthepagestobeprogrammed.Therefore,LSBdoesn'tneedtobepage0.
(128)
:
(32)
:
(3)
(2)
(1)
Page127
Page31
Page2
Page1
Page0
Dataregister
FromtheLSBpagetoMSBpageDATAIN:Data(1) Data(128)
Page127
(128)
:
(1)
:
(3)
(32)
(2)
Dataregister
Page31
Page2
Page1
Page0
Ex.)Randompageprogram(Prohibition)DATAIN:Data(1) Data(128)
SystemInterfaceUsingCEdon’t-care.
Foraneasiersysteminterface,CEmaybeinactiveduringthedata-loadingorserialaccessasshownbelow.Theinternal2,112bytedataregistersareutilizedasseparatebuffersforthisoperationandthesystemdesigngetsmoreflexible.Inaddition,forvoiceoraudioapplicationswhichuseslowcycletimeontheorderof-seconds,de-activatingCEduringthedata-loadingandserialaccesswouldprovidesignificantsavingsinpowerconsumption.
Figure4.ProgramOperationwithCEdon’t-care.
CEdon’t-care
CE
WEALE
I/Ox
80h
Address(5Cycles)
DataInput
DataInput
10h
tCS
tCH
tCEA
CE
CE
tREA
tWP
RE
WE
I/O0~7
out
Figure5.ReadOperationwithCEdon’t-care.
CLE
CEdon’t-care
CE
RE
CLE
tR
ALE
R/B
WE
00h
Address(5Cycle)
30h
DataOutput(serialaccess)
I/Ox
NOTE
Device
I/O
DATA
ADDRESS
I/Ox
DataIn/Out
Col.Add1
Col.Add2
RowAdd1
RowAdd2
RowAdd3
K9G8G08U0M
I/O0~I/O7
~2,112byte
A0~A7
A8~A11
A12~A19
A20~A27
A28~A30
CommandLatchCycle
tCLS
tCLH
tCS
tCH
tWP
tALS
tALH
tDS
tDH
Command
CLE
CE
WE
ALE
I/Ox
AddressLatchCycle
tCS
tWC
tWC
tWC
tWC
tWP
tWP
tWP
tWP
tALS
tWHtALH
tWH
tALS
tALH
tALS
tWHtALH
tALS
tWHtALH
tALS
tALH
tDS
tDH
tDS
tDH
tDStDH
tDS
tDH
tDS
tDH
Col.Add1
Col.Add2
RowAdd1
RowAdd2
RowAdd3
CLE
CE
WE
ALE
I/Ox
InputDataLatchCycle
tCLH
tCH
tALS
tWC
tWP
tWP
tDS
tWHtDH
tDS
tDH
tDS
tDH
DIN0
DIN1
DINfinal
tWP
CLE
CE
ALE
WE
I/Ox
*SerialAccessCycleafterRead(CLE=L,WE=H,ALE=L)
CE
RE
I/Ox
R/B
tRC
tREH
tREA
tREA
tREA
tCHZ
tCOH
tRHZ
Dout
Dout
tRHZtRHOH
Dout
tRR
NOTES:Transitionismeasuredat200mVfromsteadystatevoltagewithload.
Thisparameterissampledandnot100%tested.tRLOHisvalidwhenfrequencyishigherthan20MHz.
tRHOHstartstobevalidwhenfrequencyislowerthan20MHz.
tRC
tRP
tREH
tCHZtCOH
tREA
tCEA
tREAtRLOH
tRHZ
tRHOH
Dout Dout
tRR
SerialAccessCycleafterRead(EDOType,CLE=L,WE=H,ALE=L)
CE
RE
I/Ox
R/B
NOTES:Transitionismeasuredat200mVfromsteadystatevoltagewithload.
Thisparameterissampledandnot100%tested.tRLOHisvalidwhenfrequencyishigherthan20MHz.
tRHOHstartstobevalidwhenfrequencyislowerthan20MHz.
StatusReadCycle
tCLR
tCLS
tCLH
tCS
tCH
tWP
tCEA
tWHR
tCHZ
tCOH
tDS
tDH
tIR
tREA
70h
tRHZtRHOH
StatusOutput
CLE
CE
WE
RE
I/Ox
ReadOperation
tWC
tWB
tCSD
tAR
tR
tRC
tRHZ
tRR
00h Col.Add1Col.Add2RowAdd1RowAdd2RowAdd3 30h
DoutN DoutN+1
DoutM
ColumnAddress RowAddress
Busy
tCLR
CLE
CE
WE
ALE
RE
I/Ox
R/B
ReadOperation(InterceptedbyCE)
tCLR
tCSD
tCHZ
tWB
tCOH
tAR
tR
tRC
tRR
00h Col.Add1Col.Add2RowAdd1RowAdd2RowAdd3 30h
DoutN DoutN+1 DoutN+2
ColumnAddress RowAddress
Busy
CLE
CE
WE
ALE
RE
I/Ox
R/B
Advance
FLASHMEMORY
K9LAG08U1MK9G8G08U0M
RandomDataOutputInaPage
tCLR
tWHR
tAR
tRHW
tR
tRC
tREA
tRR
00h Col.Add1Col.Add2RowAdd1RowAdd2RowAdd3 30h
DoutN DoutN+1
05h
DoutMDoutM+1
ColumnAddress RowAddress
ColAdd1ColAdd2 E0h
ColumnAddress
Busy
CLE
CE
WE
22
ALE
RE
I/Ox
R/B
K9LAG08U1MK9G8G08U0M
Advance
FLASHMEMORY
PageProgramOperation
CLE
CE
WE
ALE
RE
I/Ox
R/B
tWC
tWC
tWC
tADL
tWB tPROG
tWHR
80h
Co.lAdd1Col.Add2RowAdd1RowAdd2RowAdd3
DinN
DinM
10h
SerialData
In
1uptomByte Program
putCommand
ColumnAddress
RowAddress
SerialInput
Command
70h I/O0
ReadStatusCommand
I/O0=0SuccessfulProgramI/O0=1ErrorinProgram
23
CLE
PageProgramOperationwithRandomDataInput
Advance
FLASHMEMORY
K9LAG08U1MK9G8G08U0M
tWC
tWC
tWC
tADL
tADL
tWB tPROG
tWHR
80h
Col.Add1Col.Add2RowAdd1RowAdd2RowAdd3 Din
N
DinM
85h
Col.Add1Col.Add2 DinJ
DinK
10h
SerialData
I
nputCommand
ColumnAddress
RowAddress
SerialInput RandomDataColumnAddress
InputCommand
SerialInput
Program
d
Comman
70h I/O0
ReadStatusCommand
CE
WE
24
ALE
RE
I/Ox
R/B
K9LAG08U1MK9G8G08U0M
Advance
FLASHMEMORY
BlockEraseOperation
tWC
tWB
tBERS
60h RowAdd1RowAdd2RowAdd3D0h
70h
I/O0
RowAddress
Busy
tWHR
CLE
CE
WE
ALE
RE
I/Ox
R/B
AutoBlockEraseSetupCommand
EraseCommand
ReadStatusCommand
I/O0=0SuccessfulEraseI/O0=1ErrorinErase
25
TnweoP-ageProgramOperation
tWC
tDBSY
tWB
tWBtPROG
tWHR
80h
A0~A7A8~A11A12~A19A20~A27A28~A30
Din
Din
N
M
11h
81h
A0~A7A8~A11A12~A19A20~A27A28~A30
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