研究生高等儀器綜合告

1、Department of Chemistry, Tianjin University考試時(shí)間：第考試時(shí)間：第19周（周（12月月30日）日） 晚上晚上7:00地點(diǎn)：地點(diǎn)：23-306 高等儀器分析化學(xué)及實(shí)驗(yàn)考試 Department of Chemistry, Tianjin University納米材料表征的手段：納米材料表征的手段： 用用XRD表征晶體結(jié)構(gòu)表征晶體結(jié)構(gòu) 用用SEM表征形貌表征形貌, 用用EDX分析組成分析組成(10%誤差誤差) 用用TEM表征其微結(jié)構(gòu)表征其微結(jié)構(gòu)(是否是單晶是否是單晶,是什么晶形的是什么晶形的,生長(zhǎng)取向生長(zhǎng)取向?)及形貌及形貌(是否是空心的、核殼結(jié)構(gòu)嗎等）

2、是否是空心的、核殼結(jié)構(gòu)嗎等） 用用Scanning TEM(STEM) elemental mapping(適用于原子適用于原子序數(shù)比較大的材料）和序數(shù)比較大的材料）和Electron energy loss spectroscopy (EELS) elemental mapping來進(jìn)行成份分析來進(jìn)行成份分析 用用IR光譜來表征材料的表面是否存在有機(jī)物光譜來表征材料的表面是否存在有機(jī)物 用用BET來表征材料是比面積和進(jìn)行孔徑分析來表征材料是比面積和進(jìn)行孔徑分析1. 對(duì)于平整表面上膜粗糙度或厚度的測(cè)度可用對(duì)于平整表面上膜粗糙度或厚度的測(cè)度可用AFM來測(cè)試來測(cè)試.Department of Ch

3、emistry, Tianjin UniversityXRDUV-visDepartment of Chemistry, Tianjin UniversitySEMDepartment of Chemistry, Tianjin UniversityTEMDepartment of Chemistry, Tianjin UniversitySTEM elemental mappingLine-scan EDXDepartment of Chemistry, Tianjin UniversitySEM, TEM, and STEM elemental mappingDepartment of C

4、hemistry, Tianjin UniversityDOI: 10.1002/anie.201105786 Department of Chemistry, Tianjin UniversityZnS-Amine SheetsSEMDepartment of Chemistry, Tianjin UniversityZnS-Amine SheetsTEMEELS elemental mappingDepartment of Chemistry, Tianjin UniversitySEMTEMDepartment of Chemistry, Tianjin UniversitySTEM elemental mappingTEM and SAEDPoint-scan EDXDepartment of Chemistry, Tianjin UniversitySEM看斷面，進(jìn)行厚度分析看斷面，進(jìn)行厚度分析Department of Chemistry, Tianjin UniversityXRDIRDepartment of Chemistry, Tianjin University孔結(jié)構(gòu)及尺寸可控EGBETDepartment of Chemistry, Tianjin UniversityZnSe-DET