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1、IC Function Testing SolutionsNAND Flash Integration Testing Solution -LGA Test Socket with DIP48 -LGA Test Socket with DIP48-Function:Realization Of Reading and Access the Data of NAND Flash Memory. -Application:Sampling Inspection,Testing Before and After Reballing and Reworking,FAE Analysis.etc.-C

2、ompatible with: Toshiba,Samsung,Hynix,Intel,Sandisk etc. IC Function Testing Solutions1. Feature Analysis 1. Patent structure,patent No:ZL 2012 2 0056976.7,zero abrasion on the structure. 2. ( Pusher ) Pressure adjustable, Compatible with different IC thickness.make sure the pressure could apply eve

3、nly on IC and prolong the life span of probe pin. 3. Contact with Pogo Pin, 100,000 times mating cycle.Stable performance and long life span. 4. Frame is changeable,compatible with different IC size .5. Engineering Plastics,high durability and apply to different environment,perfect insulating perfor

4、mance. Housing:AL6061Max Current Capacity : 1 AInsulationTorlonContact:Beryllium Copper AlloyInsulation Resistance :1000 m Min,At DC 500VDielectric Withstanding Voltage:700 AC / 1MinuteContact Resisitance:30m max.Mating cycles:50，000-100,000 Times aboveOperation Temperature:From -40 to + 155Compatib

5、ility2. SpecificationIC Function Testing SolutionsIC Function Testing Solutions3. 3. Overview and DimensionOverview and DimensionIC Function Testing Solutions4. Comparison with counterparts-CompetiterItemSiredaCompany “A”Remarks1Product priceLowHigh2Delivery DateTimely DeliveryCommon3MOQ1 pc Accepta

6、bleNo 1 pc order is accepted.4ProfessionalPerfectNoTechnician Account For 40% Among Employees5After-sale service PerfectCommonSupport Local service,fast response.5. Model detail LGA52/ Nand Flash Test Socket With DIP48 SolutionLGA52/ Nand Flash Test Socket With DIP48 SolutionPart NumberModelDevcie S

7、izeNo. of LeadPitchTypesRemark70E1005052700-13052E-1201-A18 X 14521.0mmPerform70E1005055700-13052E-1202-A17 X 12521.0mmPerform70E1005058700-13052E-1203-A20 X 12521.0mmPerform70E1005061700-13052E-1204-A17 X 13521.0mmPerform70E1005064700-13052E-1205-A18 X 13521.0mmPerform70E1005067700-13052E-1206-A14

8、X 11521.0mmPerform70E1005053700-13052E-1101-A18 X 14521.0mmPremium70E1005056700-13052E-1102-A17 X 12521.0mmPremium70E1005059700-13052E-1103-A20 X 12521.0mmPremium70E1005062700-13052E-1104-A17 X 13521.0mmPremium70E1005065700-13052E-1105-A18 X 13521.0mmPremium70E1005068700-13052E-1106-A14 X 11521.0mmPremiumNote : 1) The main difference between Perform and Premium is Probe material2) All sockets compatible different thickness devices (0.8mm 1.5mm) 6. Offer Integration Testing Solutio

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